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Student practical training / Master theses / Diploma theses / Compulsory internship / Volunteer internship

Synthesis and characterization of isotope specific 'in-house standards' for the analysis of boron and aluminium in very low concentrations in SiO2-phases by secondary ion mass spectrometry (Id 120)

No current offer!

Secondary Ion Mass Spectrometry (SIMS) is a microanalytical method with a very good lateral and depth resolution combined with excellent limits of detection as well as a weak degree of destruction.
However, the method is very matrix sensitive and requires matrix adapted reference materials. Actually there are no certified reference materials available for mineralogical studies. Therefore most SIMS labs use so-called ‘in-house ’ standards.
For the analysis of SiO2-phases doped silica glasses may be used. Ion implantation has proven its worth as a robust method of doping. The aim of the work is the production and characterization of such ‘in-house’ standards for 10B, 11B and 27Al.

Department: Analytics

Contact: Dr. Renno, Axel

Requirements

•You study geosciences, chemistry, physics or material's sciences
•You are interested in mineralogical and analytical problems
•You are interested in modern analytical techniques
•You show initiative and good teamwork skills

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