Master theses / Diploma theses

Secondary Ion Mass Spectrometry (SIMS) is a microanalytical method with a very good lateral and depth resolution combined with excellent limits of detection as well as a weak degree of destruction.
However, the method is very matrix sensitive and requires matrix adapted reference materials. Actually, there are no certified reference materials available for mineralogical studies. Therefore most SIMS labs use so-called ‘in-house’ standards.
The concentration of trace elements in minerals is of great economic importance as a quality parameter for raw materials. On the other hand, it bears very valuable genetic mineralogical information.
In collaboration with an industrial partner we will use the new method "energy-filter for ion implantation" as a tool for the production of matrix-matched reference materials (RMs) with a homogeneous trace element distribution in all three dimensions. These RMs will be used for SIMS and EPMA purposes.
The thesis project has the following aims:

• Determination of implantation possibilities for selected elements over the complete range of densities of naturally minerals using the available filters
• Calculation of the implantation parameters
• Experimental test of these parameters on selected minerals
• Test of the implantation by means of SIMS and EPMA

• You study physics, material's sciences or engineering
• You are interested in mineralogical or analytical problems
• You are interested in modern analytical techniques
• You show initiative and good teamwork skills

Start immediately
project period in accordance withe respective study regulations (est. 6 month)