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Data publication: A weak-labelling and deep learning approach for in-focus object segmentation in 3D widefield microscopy

Li, R.; Kudryashev, M.; Yakimovich, A.

D. rerio 3D microscopy and in-focus pixel segmentation.

Keywords: weak-labeling; deep neural network; widefield microscopy; surrogate model

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Permalink: https://www.hzdr.de/publications/Publ-37348