ROBL Publications Materials Research

2016

  1. Putero, M., Coulet, M.-V., Muller, C., Baehtz, C., Raoux, S., and Cheng, H.-Y., 2016. Ge-doped GaSb thin films with zero mass density change upon crystallization for applications in phase change memories. Appl. Phys. Lett. 108.
  2. Caneva, S., Weatherup, R. S., Bayer, B. C., Blume, R., Cabrero-Vilatela, A., Braeuninger-Weirner, P., Martin, M. B., Wang, R. Z., Baehtz, C., Schloegl, R., Meyer, J. C., and Hofmann, S., 2016. Controlling Catalyst Bulk Reservoir Effects for Monolayer Hexagonal Boron Nitride CVD. Nano Lett. 16, 1250-1261.
  3. Gruber, W., Baehtz, C., Horisberger, M., Ratschinski, I., and Schmidt, H., 2016. Microstructure and strain relaxation in thin nanocrystalline platinum films produced via different sputtering techniques. Applied Surface Science 368, 341-347.
  4. Rafaja, D., Wüstefeld, C., Abrasonis, G., Braeuniga, S., Baehtz, C., Hanzig, F., Dopita, M., Krause, M., and Gemming, S., 2016. Thermally induced formation of metastable nanocomposites in amorphous Cr-Zr-O thin films deposited using reactive ion beam sputtering. Thin Solid Films 612, 430–436.
  5. Yuan, Y., Huebner, R., Liu, F., Sawicki, M., Gordan, O., Salvan, G., Zahn, D. R. T., Banerjee, D., Baehtz, C., Helm, M., and Zhou, S., 2016. Ferromagnetic Mn-Implanted GaP: Microstructures vs Magnetic Properties. ACS Applied Materials & Interfaces 8, 3912-3918.

2015

  1. Buljan, M., Facsko, S., Marion, I. D., Trontl, V. M., Kralj, M., Jercinovic, M., Baehtz, C., Muecklich, A., Holy, V., Radic, N., and Grenzer, J., 2015. Self-assembly of Ge quantum dots on periodically corrugated Si surfaces. Appl. Phys. Lett. 107.
  2. Burlaka, V., Wagner, S., and Pundt, A., 2015. In-situ STM and XRD studies on Nb-H films: Coherent and incoherent phase transitions. J. Alloy. Compd. 645, S388-S391.
  3. Caneva, S., Weatherup, R. S., Bayer, B. C., Brennan, B., Spencer, S. J., Mingard, K., Cabrero-Vilatela, A., Baehtz, C., Pollard, A. J., and Hofmann, S., 2015. Nucleation Control for Large, Single Crystalline Domains of Mono layer Hexagonal Boron Nitride via Si-Doped Fe Catalysts. Nano Lett. 15, 1867-1875.
  4. Cavaleiro, A. J., Ramos, A. S., Martins, R. M. S., Fernandes, F. M. B., Morgiel, J., Baehtz, C., and Vieira, M. T., 2015. Phase transformations in Ni/Ti multilayers investigated by synchrotron radiation-based x-ray diffraction. J. Alloy. Compd. 646, 1165-1171.
  5. Escudeiro, A., Figueiredo, N. M., Polcar, T., and Cavaleiro, A., 2015. Structural and mechanical properties of nanocrystalline Zr co-sputtered a-C(:H) amorphous films. Applied Surface Science 325, 64-72.
  6. Hanzig, J., Mehner, E., Jachalke, S., Hanzig, F., Zschornak, M., Richter, C., Leisegang, T., Stoecker, H., and Meyer, D. C., 2015. Dielectric to pyroelectric phase transition induced by defect migration. New Journal of Physics 17.
  7. Hauge, H. I. T., Verheijen, M. A., Conesa-Boj, S., Etzelstorfer, T., Watzinger, M., Kriegner, D., Zardo, I., Fasolato, C., Capitani, F., Postorino, P., Kolling, S., Li, A., Assali, S., Stangl, J., and Bakkers, E. P. A. M., 2015. Hexagonal silicon realized. Nano Lett. 15, 5855-5860.
  8. Khalid, M., Gao, K., Weschke, E., Huebner, R., Baehtz, C., Gordan, O., Salvan, G., Zahn, D. R. T., Skorupa, W., Helm, M., and Zhou, S., 2015. A comprehensive study of the magnetic, structural, and transport properties of the III-V ferromagnetic semiconductor InMnP. J. Appl. Phys. 117.
  9. Minikayev, R., Paszkowicz, W., Piszora, P., Knapp, M., Baehtz, C., and Podsiadlo, S., 2015. Thermal expansion of polycrystalline gallium nitride: an X-ray diffraction study. X-Ray Spectrometry 44, 382-388.
  10. Piskorska-Hommel, E., Winiarski, M. J., Kunert, G., Demchenko, I. N., Roshchupkina, O. D., Grenzer, J., Falta, J., Hommel, D., and Holy, V., 2015. The electronic structure of homogeneous ferromagnetic (Ga, Mn)N epitaxial films. J. Appl. Phys. 117.
  11. Vlcek, M., Lukac, F., Vlach, M., Wagner, S., Uchida, H., Baehtz, C., Shalimov, A., Pundt, A., and Cizek, J., 2015. Influence of microstructure and mechanical stress on behavior of hydrogen in 500 nm Pd films. J. Alloy. Compd. 645, S446-S449.
  12. Vrankic, M., Grzeta, B., Luetzenkirchen-Hecht, D., Bosnar, S., and Saric, A., 2015. Chromium environment within Cr-doped BaAl2O4: Correlation of X-ray diffraction and X-ray absorption spectroscopy investigations. Inorganic Chemistry 54, 11127-11135.
  13. Walus, S., Barchasz, C., Bouchet, R., Lepretre, J.-C., Colin, J.-F., Martin, J.-F., Elkaim, E., Baehtz, C., and Alloin, F., 2015. Lithium/Sulfur Batteries Upon Cycling: Structural Modifications and Species Quantification by In Situ and Operando X-Ray Diffraction Spectroscopy. Advanced Energy Materials 5.
  14. Walus, S., Barchasz, C., Bouchet, R., Martin, J. F., Lepretre, J. C., and Alloin, F., 2015. Non-woven carbon paper as current collector for Li-ion/Li2S system: Understanding of the first charge mechanism. Electrochimica Acta 180, 178-186.
  15. Yildirim, O., Cornelius, S., Butterling, M., Anwand, W., Wagner, A., Smekhova, A., Fiedler, J., Boettger, R., Baehtz, C., and Potzger, K., 2015. From a non-magnet to a ferromagnet: Mn+ implantation into different TiO2 structures. Appl. Phys. Lett. 107.
  16. Yildirim, O., Cornelius, S., Smekhova, A., Zykov, G., Gan'shina, E. A., Granovsky, A. B., Huebner, R., Baehtz, C., and Potzger, K., 2015. The local environment of cobalt in amorphous, polycrystalline and epitaxial anatase TiO2:Co films produced by cobalt ion implantation. J. Appl. Phys. 117.
  17. Yuan, Y., Wang, Y., Gao, K., Khalid, M., Wu, C., Zhang, W., Munnik, F., Weschke, E., Baehtz, C., Skorupa, W., Helm, M., and Zhou, S., 2015. High Curie temperature and perpendicular magnetic anisotropy in homoepitaxial InMnAs films. Journal of Physics D-Applied Physics 48.
  18. Zhou, S., Liu, F., Prucnal, S., Gao, K., Khalid, M., Baehtz, C., Posselt, M., Skorupa, W., and Helm, M., 2015. Hyperdoping silicon with selenium: solid vs. liquid phase epitaxy. Scientific Reports 5.

2014

  1. Conesa-Boj, S., Kriegner, D., Han, X.-L., Plissard, S., Wallart, X., Stangl, J., Fontcuberta i Morral, A., and Caroff, P., 2014. Gold-Free Ternary III-V Antimonide Nanowire Arrays on Silicon: Twin-Free down to the First Bilayer. Nano Lett. 14, 326-332.
  2. Gao, K., Prucnal, S., Huebner, R., Baehtz, C., Skorupa, I., Wang, Y., Skorupa, W., Helm, M., and Zhou, S., 2014. Ge1-xSnx alloys synthesized by ion implantation and pulsed laser melting. Appl. Phys. Lett. 105.
  3. Bayer, B. C., Baehtz, C., Kidambi, P. R., Weatherup, R. S., Mangler, C., Kotakoski, J., Goddard, C. J. L., Caneva, S., Cabrero-Vilatela, A., Meyer, J. C., and Hofmann, S., 2014. Nitrogen controlled iron catalyst phase during carbon nanotube growth. Appl. Phys. Lett. 105.
  4. Gruber, W., Rahn, J., Baehtz, C., Horisberger, M., Geckle, U., and Schmidt, H., 2014. Influence of a passivation layer on strain relaxation and lattice disorder in thin nano-crystalline Pt films during in-situ annealing. Thin Solid Films 565, 79-83.
  5. Khalid, M., Prucnal, S., Liedke, M. O., Gao, K., Facsko, S., Skorupa, W., Helm, M., and Zhou, S., 2014. Synthesis and characterization of MnAs and MnP nanoclusters embedded in III–V semiconductors. Materials Research Express 1, 026105.
  6. Kidambi, P. R., Blume, R., Kling, J., Wagner, J. B., Baehtz, C., Weatherup, R. S., Schloegl, R., Bayer, B. C., and Hofmann, S., 2014. In Situ Observations during Chemical Vapor Deposition of Hexagonal Boron Nitride on Polycrystalline Copper. Chem. Mater. 26, 6380-6392.
  7. Krause, M., Buljan, M., Muecklich, A., Moeller, W., Fritzsche, M., Facsko, S., Heller, R., Zschornak, M., Wintz, S., Luis Endrino, J., Baehtz, C., Shalimov, A., Gemming, S., and Abrasonis, G., 2014. Compositionally modulated ripples during composite film growth: Three-dimensional pattern formation at the nanoscale. Phys. Rev. B 89.
  8. Menendez, E., Dias, T., Geshev, J., Lopez-Barbera, J. F., Nogues, J., Steitz, R., Kirby, B. J., Borchers, J. A., Pereira, L. M. C., Vantomme, A., and Temst, K., 2014. Interdependence between training and magnetization reversal in granular Co-CoO exchange bias systems. Phys. Rev. B 89.
  9. Menendez, E., Modarresi, H., Dias, T., Geshev, J., Pereira, L. M. C., Temst, K., and Vantomme, A., 2014. Tuning the ferromagnetic-antiferromagnetic interfaces of granular Co-CoO exchange bias systems by annealing. J. Appl. Phys. 115.
  10. Perez-Flores, J. C., Baehtz, C., Kuhn, A., and Garcia-Alvarado, F., 2014. Hollandite-type TiO2: a new negative electrode material for sodium-ion batteries. Journal of Materials Chemistry A 2, 1825-1833.
  11. Putero, M., Coulet, M.-V., Muller, C., Cohen, G., Hopstaken, M., Baehtz, C., and Raoux, S., 2014. Density change upon crystallization of Ga-Sb films. Appl. Phys. Lett. 105.
  12. Rafaja, D., Wuestefeld, C., Dopita, M., Motylenko, M., Baehtz, C., Michotte, C., and Kathrein, M., 2014. Crystallography of phase transitions in metastable titanium aluminium nitride nanocomposites. Surf. Coat. Tech. 257, 26-37.
  13. Rafaja, D., Wüstefeld, C., Dopita, M., Motylenko, M., and Baehtz, C., 2014. Capability of X-ray diffraction for the study of microstructure of metastable thin films. IUCrJ 1, 446-456.
  14. Roshchupkina, O. D., Strache, T., McCord, J., Muecklich, A., Baehtz, C., and Grenzer, J., 2014. Structural modifications of thin magnetic Permalloy films induced by ion implantation and thermal annealing: A comparison. Acta Materialia 74, 278-284.
  15. Wang, Y., Chen, X., Li, L., Shalimov, A., Tong, W., Prucnal, S., Munnik, F., Yang, Z., Skorupa, W., Helm, M., and Zhou, S., 2014. Structural and magnetic properties of irradiated SiC. J. Appl. Phys. 115.

2013

  1. Buljan, Maja; Roshchupkina, Olga; Santic, Growth of a three-dimensional anisotropic lattice of Ge quantum dots in an amorphous alumina matrix J. Appl. Cryst., 46 (2013), 709-715
  2. Braz Fernandes, F. M.; Mahesh, K. K.; Martins, R. M. S.; Silva, R.J.C., Baehtz, C., Borany v.J..; Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity; Mater. Charact., 76, (2013), 35-38
  3. F. Lukáč, J. Čížek, M. Vlcek, I. Procházka, M. Vlach, W. Anwand, G. Brauer, F. Traege, D. Rogalla. H. W. Becker, S. Wagner, H. Uchida, C. Bähtz; Hydrogen interaction with defects in ZnO; Mater. Sci. Forum, 733, (2013), 228-231
  4. J. Čížek, F. Lukáč, M. Vlček, M. Vlach, I. Procházka, F. Traeger, D. Rogalla, H. W. Becker, W. Anwand, G. Brauer, S. Wagner, H. Uchida, A. Pundt, C. Bähtz, Anisotropy of Hydrogen Diffusivity in ZnO;  Defect Diffus. Forum, 333, (2013), 39-49
  5. R. S. Weatherup,C. Baehtz, B. Dlubak, B. C. Bayer, P. R. Kidambi, R. Blume, R. Schloegl, Stephan Hofmann, Introducing Carbon Diffusion Barriers for Uniform, High-Quality Graphene Growth from Solid Sources, Nano Lett. 13, (2013), 4624-4631
  6. P. R. Kidambi, B. C. Bayer, R. Blume, Z.-J. Wang, C. Baehtz, R. S. Weatherup, M.-G. Willinger, R. Schloegl,S. Hofmann, Observing Graphene Grow: Catalyst − Graphene Interactions during Scalable Graphene Growth on Polycrystalline Copper, Nano Lett. 13, (2013), 4769−4778
  7. M. Putero, M.-V. Coulet, T. Ouled-Khachroum, C. Muller, C. Baehtz, S. Raoux; Unusual crystallization behavior in Ga-Sb phase change alloys; APL Mater, 1, (2013), 0621010
  8. M. Putero, M.-V. Coulet, T. Ouled-Khachroum, C. Muller, C. Baehtz, Phase transition in stoichiometric GaSb thin films: Anomalous density change and phase segregation, Appl. Phys. Lett., 103, (2013), 231912

2012

  1. J. C. Perez-Flores, C. Baehtz, M. Hoelzel, A. Kuhn and F. Garcia-Alvarado, Full structural and electrochemical characterization of Li2Ti6O13 as anode for Li-ion batteries, Phys. Chem. Chem. Phys., 14, (2012), 2892–2899.
  2. L. Simonin, J.-F. Colin, V. Ranieri, E. Canevet, J.-F. Martin, C. Bourbon, C. Baehtz, P. Strobel, L. Daniel, S. Patoux, In situ investigations of a Li-rich Mn-Ni layered oxide for Li-ion batteries. J. Mater. Chem.,22, (2012), 11316-11322   
  3. J. C. Perez-Flores, C. Baehtz, M. Hoelzel, A. Kuhn, F. Garcia-Alvarado, H2Ti6O13, a new protonated titanate prepared by Li+/H+ ion exchange: synthesis, crystal structure and electrochemical Li insertion properties, RSC Advances, 8 , (2012), 3530-3540   
  4. R.S. Weatherup, B.C.Bayer, R. Blume, C. Baehtz, P.R. Kidambi, M. Fouquet,C.T. Wirth, R. Schlögl, R, S. Hofmann, S (2012) On the Mechanisms of Ni-Catalysed Graphene Chemical Vapour Deposition, Chem. Phys. Chem., 13, (2012), 2544 – 2549
  5. O. D. Roshchupkina, J. Grenzer, T. Strache, J. McCord, M. Fritzsche, A. Muecklich, C. Baehtz, J. Fassbender, Focused ion beam induced structural modifications in thin magnetic films, J. Appl. Phys. 112, (2012), 339011-339017
  6. M. Krause, A. Muecklich, T. W. H. Oates, M. Zschornak, S. Wintz, J. L. Endrino, C. Baehtz, A. Shalimov, S. Gemming, G. Abrasonis, Tilting of carbon encapsulated metallic nanocolumns in carbon-nickel nanocomposite films by ion beam assisted deposition, Appl. Phys. Lett., 101, (2012), 531121- 531125
  7. Christoph T. Wirth, Bernhard C. Bayer, Andrew D. Gamalski, Santiago Esconjauregui, Robert S. Weatherup, Caterina Ducati, Carsten Baehtz, John Robertson, Stephan Hofmann, The Phase of Iron Catalyst Nanoparticles during Carbon Nanotube Growth, Chem. Mater., 24, (2012), 4633−4640
  8. B. Ding, F. Cheng, F. Pan, T. Fa, S. Yao, K. Potzger, S. Zhou, The correlation between structure and magnetism of Ni-implanted TiO2 annealed at different temperatures, J. Magn. Mater. 324 (2012), 33-36
  9. R. M. S. Martins, N. Schell, K. K. Mahesh, R. J. C. Silva, F. M. Braz Fernandes, X-ray diffraction studies during magnetron co-sputtering of Ni-Ti shape memory alloy films Ciência & Tecnologia dos Materiais 24, (2012), 161-169
  10. S. Zhou, W. Zhang, A. Shalimov, Y. Wang, Z. Huang, D. Buerger, A. Mücklich, W. Zhang, H. Schmidt, M. Helm, Magnetic Mn5Ge3 nanocrystals embedded in crystalline Ge: a magnet/semiconductor hybrid synthesized by ion implantation, Nanoscale Res. Lett. 7, (2012), 528

2011

  1. S. Prucnal, M. Turek , A. Drozdziel, K. Pyszniak, A. Wójtowicz, S. Zhou, A. Kanjilal, A. Shalimov, W. Skorupa, J. Zuk, Optical and microstructural properties of self-assembled InAs quantum structures in silicon,Cent. Eur. J. Phys., 9,(2011), 338-343.
  2. Rafaja, D., Wüstefeld, C., Baehtz, C., Klemm, V., Dopita, M., Motylenko, M., Michotte, C., Kathrein, M., Effect of internal interfaces on hardness and thermal stability of nanocrystalline Ti0.5Al0.5N coatings, Metallurgical and Materials Transactions 42A (2010), 559-569.
  3. S. Kalinichenka, L. Röntzsch, C. Baehtz, T. Weißgärber, B. Kieback, Hydrogen desorption properties of melt-spun and hydrogenated Mg-based alloys using in situ synchrotron X-ray diffraction and TGA, J. Alloys. Comp., 509S ,(2011) S629-S632.
  4. B. Bayer, S. Hofmann, C. Castellarin-Cudia, R. Blume, C. Baehtz, S. Esconjauregui, C.T. Wirth, R.A. Oliver, C. Ducati, A. Knop-Gericke, R. Schlogl, A. Goldoni, C. Cepek, J. Robertson, Support-Catalyst-Gas Interactions During Carbon Nanotube Growth on Metallic Ta Films, J. Phys. Chem., 115, (2011), 4359–4369.
  5. B.C. Bayer; S. Sanjabi, C. Baehtz, C.T. Wirth, S. Esconjauregui; R.S. Weatherup; Z. H. Barber, S. Hofmann, J. Robertson, Carbon Nanotube forest growth on NiTi Shape Memory Alloy thin films for thermal actuation, Thin Solid Films 519 (2011), 6126-6129.
  6. S. Wagner, H. Uchida, V. Burlaka, M. Vlach, M. Vlcek, F. Lukac, J. Cizek, C. Baehtz, A. Bell, A. Pundt, Achieving coherent phase transition in palladium–hydrogen, thin films, Scripta Materialia, 64 (2011) 978–981.
  7. M.E. Arroyo-de Dompablo, U. Amador, E. Lozano, C. Baehtz, E. Morán, A.F. Fuentes, Reactivity of Nano-LaPO4 Composites in Lithium Cells: Role of the Particle Size, ECS Trans. 33, (2011) 101-110.
  8. N. Zotov, J. Feydt, A. Savan, A. Ludwig, J. v. Borany, Interdiffusion in Fe/Pt Multilayers: In Situ High Temperature Synchrotron Radiation Reflectivity Study, Advanced Engineering Materials, 13, (2011), 475-479.
  9. B. Nath Dev, S. Roy, S. Bera, Y. Tawara, N. Schell, Jörg Grenzer, J. v. Borany, R, Grötzschel, Ion-Irradiated Laterally Graded Ni/C Multilayers: A Combined X-ray Standing Wave and X-ray Reflectivity Analysis; Japanese Journal of Applied Physics 50 (2011) 052501
  10. S. Esconjauregui, B. C. Bayer, M. Fouquet, C. T. Wirth, F. Yan, R. Xie, C. Ducati, C. Baehtz, C. Castellarin-Cudia, S. Bhardwaj, C. Cepek, S. Hofmann, and J. Robertson; Use of plasma treatment to grow carbon nanotube forests on TiN substrate; J. Appl. Phys. 109, (2011), 114312;
  11. B. C. Bayer, C. Zhang, R. Blume, F. Yan, M. Fouquet, C. T. Wirth, R. S. Weatherup, L. Lin, C. Baehtz, R. A. Oliver, A. Knop-Gericke, R. Schlögl, S. Hofmann, and J. Robertson; In-situ study of growth of carbon nanotube forests on conductive CoSi2 support; J. Appl. Phys. 109, (2011), 114314-21
  12. S. Prucnal, S. Facsko, C. Baumgart, H. Schmidt, M. O. Liedke, L. Rebohle, A. Shalimov, H. Reuther, A. Kanjilal, A. Mücklich, M. Helm, J. Zuk, W. Skorupa; n-InAs Nanopyramids Fully Integrated into Silicon Nano Lett., 11, (2011), 2814–2818
  13. R. S. Weatherup, B. C. Bayer, R. Blume, C. Ducati, C. Baehtz, R. Schloegl, S. Hofmann, In Situ Characterization of Alloy Catalysts for Low-Temperature Graphene Growth, Nano Lett. , 11, (2011), 4154–4160.
  14. M. Krause, M. Vinnichenko, N. Shevchenko, A. Muecklich, S. Gemming, F. Munnik, A. Rogozin, A. Kolitsch, W. Moeller, Phase Segregation and Transformations in Arsenic-Implanted ZnO Thin Films, J. Phys. Chem. C, 115 (2011), 8798–8807.
  15. J. Gaca, M. Wojcik, M. Bugajski, K. Kosiel, The determination of the chemical composition profile of the GaAs/AlGaAs heterostructures designed for quantum cascade lasers by means of synchrotron radiation, Radiation Physics and Chemistry, 80 (2011) 1112–1118.
  16. A. Navarro-Quezada, N. Gonzalez Szwacki, W. Stefanowicz, Tian Li, A. Grois, T. Devillers, M. Rovezzi,R. Jakieła, B. Faina, J. A. Majewski, M. Sawicki, T. Dietl, A. Bonanni, Fe-Mg interplay and the effect of deposition mode in (Ga,Fe)N doped with Mg, PHYS. REV. B, 84, (2011), 155321-155333.
  17. Ch. Wüstefeld, D. Rafaja, M. Dopita, M. Motylenko, C. Baehtz, C. Michotte, M. Kathrein, Decomposition kinetics in Ti1-xAlxN coatings as studied by in-situ X-ray diffraction during annealing,Surface & Coatings Technology, 206, (2011), 1727–1734.
  18. W. Gruber, S. Chakravarty, C. Baehtz, W. Leitenberger, M. Bruns, A. Kobler, C. Kübel, H. Schmidt, Strain Relaxation and Vacancy Creation in Thin Platinum Films Physical Review Letters 107, (2011) 265501-5

2010

  1. Abrasonis, G.; Oates, T. W. H.; Kovacs, G. J.; Grenzer, J.; Persson, P. O. A.; Heinig, K. H. H.; Martinavicius, A.; Jeutter, N.; Baehtz, C.; Tucker, M.; Bilek, M. M. M.; Muller, W. Nanoscale precipitation patterns in carbon-nickel nanocomposite thin films: Period and tilt control via ion energy and deposition angle. Journal of Applied Physics 2010, 108.

  2. Beckers, M.; Eriksson, F.; Lauridsen, J.; Baehtz, C.; Jensen, J.; Hultman, L. Formation of basal plane fiber-textured Ti2AlN films on amorphous substrates. Physica Status Solidi-Rapid Research Letters 2010, 4, 121-123.

  3. Hanisch, A.; Biermanns, A.; Grenzer, J.; Facsko, S.; Pietsch, U. Xe ion beam induced rippled structures on differently oriented single-crystalline Si surfaces. Journal of Physics D-Applied Physics 2010, 43, 5.

  4. Hoglund, C.; Alling, B.; Birch, J.; Beckers, M.; Persson, P. O. A.; Baehtz, C.; Czigany, Z.; Jensen, J.; Hultman, L. Effects of volume mismatch and electronic structure on the decomposition of ScAlN and TiAlN solid solutions. Physical Review B 2010, 81.

  5. Kalinichenka, S.; Rontzsch, L.; Baehtz, C.; Kieback, B. Hydrogen desorption kinetics of melt-spun and hydrogenated Mg90Ni10 and Mg80Ni10Y10 using in situ synchrotron, X-ray diffraction and thermogravimetry. Journal of Alloys and Compounds 2010, 496, 608-613.

  6. Krausslich, J.; Hofer, S.; Zastrau, U.; Jeutter, N.; Baehtz, C. Temperature dependence of lattice parameters of langasite single crystals. Crystal Research and Technology 2010, 45, 490-492.

  7. Martins, R. M. S.; Schell, N.; von Borany, J.; Mahesh, K. K.; Silva, R. J. C.; Fernandes, F. M. B. Structural evolution of magnetron sputtered shape memory alloy Ni-Ti films. Vacuum 2010, 84, 913-919.

  8. Shalimov, A.; Zhou, S. Q.; Roshchupkina, O.; Jeutter, N.; Baehtz, C.; Talut, G.; Reuther, H.; Potzger, K. Multiple ferromagnetic secondary phases in Fe implanted yttria stabilized zirconia. Journal of Applied Physics 2010, 108.

  9. Vinnichenko, M.; Gago, R.; Cornelius, S.; Shevchenko, N.; Rogozin, A.; Kolitsch, A.; Munnik, F.; Moller, W. Establishing the mechanism of thermally induced degradation of ZnO:Al electrical properties using synchrotron radiation. Applied Physics Letters 2010, 96, 3.

  10. Zschintzsch, M.; Jeutter, N. M.; Borany, J. v.; Krause, M.; Muecklich, A. Reactive DC magnetron sputtering of (GeOx-SiO2) superlattices for Ge nanocrystal formation. Journal of Applied Physics 2010, 107, 034306 

  11. Talut G., Reuther H., Grenzer J., Mücklich A., Shalimov A., and Skorupa W., Spinodal decomposition and secondary phase formation in Fe-oversaturated GaN, Physical Review B 81, 155212  (2010)

  12. Martins, R.M.S., Schell, N., Reuther, H., Pereira, L., Mahesh, K.K., Silva, R.J.C., and Fernandes, F.M.B., Texture development, microstructure and phase transformation characteristics of sputtered Ni-Ti Shape Memory Alloy films grown on TiN < 111 >, Thin Solid Films 519  (2010) 122-128

2009

  1. Abrasonis, G.; Kovacs, G. J.; Mucklich, A.; Zhou, S.; Babonneau, D.; Martinavicius, A.; Berndt, M.; Munnik, F.; Vinnichenko, M.; Heinig, K. H.; Grenzer, J.; Kolitsch, A.; Schmidt, H.; Moeller, W. Substrate effects on the morphology of carbon encapsulated nickel nanoparticles grown by surface diffusion assisted phase separation. Journal of Physical Chemistry C 2009, 113 8645-8651.

  2. Beckers, M.; Hoehlund, C.; Baehtz, C.; Martins, R. M. S.; Persson, P. O. A.; Hultman, L.; Moeller, W. The influence of subtrate temperature and Al mobility on the micro structural evolution of magnetron sputtered ternary Ti-Al_N thin films. Journal of Applied Physics 2009, 106, 064915.

  3. Cantelli, V.; Von Borany, J.; Jeutter, N. M.; Grenzer, J. In situ grazing incidence scattering investigations during magnetron sputtering deposition of FePt/Ag thin films. Advanced Engineering Materials 2009, 11, 478.

  4. Kanjilal, A.; Rebohle, L.; Baddela, N. K.; Zhou, S.; Voelskow, M.; Skorupa, W.; Helm, M. Probing the impact of microstructure on the electroluminescence propoerties of Ge-nanocrystal enriched Er-doped SiO2 layers. Phys. Rev. B 2009, 79, 161302 (R).

  5. Potzger, K.; Shalimov, A.; Zhou, S.; Schmidt, H.; Mucklich, A.; Helm, M.; Fassbender, J.; Liberati, M.; Arenholz, E. Amorphous clusters in Co implanted ZnO induced by boron pre-implantation. Journal of  Physics D: Applied Physics 2009, 105, 123917.

  6. Potzger, K.; Zhou, S. Non-DMS related ferromagnetism in transition metal doped zinc oxide. Phys. Stat. Sol. (b) 2009, 246, 1147.

  7. Rogozin, A.; Vinnichenko, M.; Shevchenko, N.; Kreissig, U.; Kolitsch, A.; Möller, W. Real-time evolution of electrical properties and structure of indium oxide and indium tin oxide during crystallization. Scripta Materialia 2009, 60, 199.

  8. Shalimov, A.; Potzger, K.; Geiger, D.; Lichte, H.; Talut, G.; Misiuk, A.; Reuther, H.; Stromberg, F.; Zhou, S.; Baehtz, C.; Fassbender, J. Fe nanoparticles embedded in MgO crystals. Journal of Applied Physics 2009, 105, 064906-064907.

  9. Talut, G.; Grenzer, J.; Reuther, H.; Shalimov, A.; Baehtz, C.; Novikov, D.; Walz, B. In situ observation of secondary phase formation in Fe implanted GaN annealed in low pressure N-2 atmosphere. Applied Physics Letters 2009, 95.

  10. Zhou, S.; Potzger, K.; Xu, Q.; Kuepper, K.; Talut, G.; Marko, D.; Mucklich, A.; Helm, M.; Fassbender, J.; Arenholz, E.; Schmidt, H. Spinel ferrite nanocrystals embedded inside ZnO: magnetic, electronic and magneto-transport perperties. Phys. Rev. B 2009, 80, 094409.

  11. Zhou, S.; Potzger, K.; Xu, Q.; Talut, G.; Lorenz, M.; Skorupa, W.; Helm, M.; Fassbender, J.; Grundmann, M.; Schmidt, H. Ferromagnetic transition metal implanted ZnO: a diluted magnetic semiconductor? Vacuum 2009, 83, S13-S19.

  12. Zhou, S. Q.; Shalimov, A.; Potzger, K.; Jeutter, N. M.; Baehtz, C.; Helm, M.; Fassbender, J.; Schmidt, H. Memory effect of Mn5Ge3 nanomagnets embedded inside a Mn-diluted Ge matrix. Applied Physics Letters 2009, 95, 192505.

2008

  1. Zschech, E., et al., Nano-scale analysis using synchrotron-radiation: Applications in the semiconductor industry. Current Nanoscience, 2008. 4(3): p. 256-266.

  2. Zhou, S.Q., et al., Crystallographically oriented Fe nanocrystals formed in Fe-implanted TiO2. Journal of Applied Physics, 2008. 103(8).

  3. Zhou, S.Q., et al., Fe-implanted ZnO: Magnetic precipitates versus dilution. Journal of Applied Physics, 2008. 103(2).

  4. Salditt, T., et al., High-transmission planar x-ray waveguides. Physical Review Letters, 2008. 100(18).

  5. Martins, R.M.S., et al., Study of graded Ni-Ti shape memory alloy film growth on Si(100) substrate. Applied Physics a-Materials Science & Processing, 2008. 91(2): p. 291-299.

  6. Martins, R.M.S., et al., Role of the substrate on the growth of Ni-Ti sputtered thin films. Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2008. 481: p. 626-629.

  7. Abrasonis, G., et al., X-ray spectroscopic and magnetic investigation of C : Ni nanocomposite films grown by ion beam cosputtering. Journal of Physical Chemistry C, 2008. 112(33): p. 12628-12637.

2007

  1. Zhou S. Q., Potzger K., Zhang G. F., Mucklich A., Eichhorn F., Schell N., Grotzschel R., Schmidt B., Skorupa W., Helm M., Fassbender J., and Geiger D. (2007) Structural and magnetic properties of Mn-implanted Si. Physical Review B 75, 085203.

  2. Zhou S. Q., Potzger K., Reuther H., Talut G., Eichhorn F., von Borany J., Skorupa W., Helm M., and Fassbender J. (2007) Crystallographically oriented magnetic ZnFe2O4 nanoparticles synthesized by Fe implantation into ZnO. Journal of Physics D-Applied Physics 40, 964-969.

  3. Hoglund C., Beckers M., Schell N., von Borany J., Birch J., and Hultman L. (2007) Topotaxial growth of Ti2AlN by solid state reaction in AlN/Ti(0001) multilayer thin films. Applied Physics Letters 90, 174106.

  4. Cantelli V., von Borany J., Mucklich A., Zhou S. Q., and Grenzer J. (2007) Influence of energetic ions and neutral atoms on the L1(0) ordering of FePt films. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 257, 406-410.

  5. Beyer V., von Borany J., and Heinig K. H. (2007) Dissociation of Si+ ion implanted and as-grown thin SiO2 layers during annealing in ultra-pure neutral ambient by emanation of SiO. Journal of Applied Physics 101, 053516.

  6. Almtoft K. P., Ejsing A. M., Bottiger J., Chevallier J., Schell N., and Martins R. M. S. (2007) The dependence of the nanostructure of magnetron sputtered Cu-Ag alloy films on composition and temperature. Journal of Materials Research 22, 1018-1023.

2006

  1. Som T., Satpati B., Prokert F., Cantelli V., and Kabiraj D. (2006) Phase formation within Au and Ge nanoislands by room-temperature ion irradiation. Nanotechnology 17, 5248-5253.

  2. Sass J., Mazur K., Surma B., Eichhorn F., Litwin D., Galas J., and Sitarek S. (2006) X-ray studies of ultra-thin Si wafers for mirror application. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 253, 236-240.

  3. Rogozin A., Shevchenko N., Vinnichenko M., Seidel M., Kolitsch A., and Moller W. (2006) Annealing of indium tin oxide films by electric current: Properties and structure evolution. Applied Physics Letters 89, 061908.

  4. Potzger K., Zhou S. Q., Eichhorn F., Helm M., Skorupa W., Mucklich A., Fassbender J., Herrmannsdorfer T., and Bianchi A. (2006) Ferromagnetic Gd-implanted ZnO single crystals. Journal of Applied Physics 99.

  5. Potzger K., Zhou S. Q., Reuther H., Mucklich A., Eichhorn F., Schell N., Skorupa W., Helm M., Fassbender J., Herrmannsdorfer T., and Papageorgiou T. P. (2006) Fe implanted ferromagnetic ZnO. Applied Physics Letters 88, 052508.

  6. Pereira L., Martins R. M. S., Schell N., Fortunato E., and Martins R. (2006) Nickel-assisted metal-induced crystallization of silicon: Effect of native silicon oxide layer. Thin Solid Films 511, 275-279.

  7. Pelka J. B., Brust M., Gierlowski P., Paszkowicz W., and Schell N. (2006) Structure and conductivity of self-assembled films of gold nanoparticles. Applied Physics Letters 89, 063110.

  8. Paula A. S., Canejo J. H. P., Mahesh K. K., Silva R. J. C., Fernandes F. M. B., Martins R. M. S., Cardoso A. M. A., and Schell N. (2006) Study of the textural evolution in Ti-rich NiTi using synchrotron radiation. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms 246, 206-210.

  9. Martins R. M. S., Schell N., Beckers M., Mahesh K. K., Silva R. J. C., and Fernandes F. M. B. (2006) Growth of sputter-deposited Ni-Ti thin films: Effect of a SiO2 buffer layer. Applied Physics a-Materials Science & Processing 84, 285-289.

  10. Martins R. M. S., Schell N., Beckers M., Silva R. J. C., Mahesh K. K., and Braz Fernandes F. M. (2006) In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by x-ray diffraction. ADVANCED MATERIALS FORUM III, PTS 1 AND 2 MATERIALS SCIENCE FORUM Sensors and Actuators B 514-516, 1588-1592.

  11. Martins R. M. S., Braz Fernandes F. M., Silva R. J. C., Pereira L., Gordo P. R., Maneira M. J. P., Beckers M., Mücklich A., and Schell N. (2006) The influence of a poly-Si intermediate layer on the crystallization behaviour of Ni-Ti SMA magnetron sputtered thin films. Applied Physics A: Materials Science & Processing 83, 139-145.

  12. Martins R. M. S., Braz Fernandes F. M., Silva R. J. C., Beckers M., and Schell N. (2006) Structural in-situ studies of Ni-Ti thin films. Proceedings of Shape Memory and Superelastic Technologies 2004, 421-426.

  13. Martins R. M. S., Braz Fernandes F. M., Silva R. J. C., Beckers M., and Schell N. (2006) In-situ observation of Ni-Ti thin film growth by synchrotron radiation scattering. Materials Science Forum 514-516, 1588-1592.

  14. Hahn T., Cieslak J., Metzner H., Eberhardt J., Reislöhner U., Gossla M., Witthuhn W., and Kräußlich J. (2006) Metastability of CuInS2 and its implications on thin film growth. Applied Physics Letters 88, 171915.

  15. Cantelli V., Von Borany J., Grenzer J., Fassbender J., Kaltofen R., and Schumann J. (2006) Influence of He-ion irradiation on thin NiMn/FeNi exchange bias films. Journal of Applied Physics 99, 08C102.

  16. Braz Fernandes F. M., Paula A. S., Canejo J. P. H. G., Mahesh K. K., Martins R. M. S., Cardoso A. M. A., and Schell N. (2006) Texture evolution during annealing of Ni-Ti SMA. Proceedings of Shape Memory and Superelastic Technologies 2004, 45-50.

  17. Beckers M., Schell N., Martins R. M. S., Mucklich A., and Moller W. (2006) Phase stability of epitaxially grown Ti2AlN thin films. Applied Physics Letters 89, 074101.

  18. Beckers M., Schell N., Martins R. M. S., Mucklich A., Moller W., and Hultman L. (2006) Microstructure and nonbasal-plane growth of epitaxial Ti2AlN thin films. Journal of Applied Physics 99, 052508.

2005

  1. Thiele E., Klemm R., Hollang  L., Holste C., Schell, N., Natter H., and Hempelmann R. (2005) An approach to cyclic plasticity and deformation-induced structure changes of electrodeposited nickel. Materials Science and Engineering A 390, 42-51.

  2. Schell N., Martins R. M. S., and Braz Fernandes F. M. (2005) Real-time and in-situ structural design of functional NiTi SMA thin films. Applied Physics A: Materials Science & Processing 81, 1141-1145.

  3. Schell N., Andreasen K. P., Bøttiger J., and Chevallier J. (2005) On the dependence on bias voltage of the structural evolution of magnetron-sputtered nanocrystalline Cu films during thermal annealing. Thin Solid Films 476, 280-287.

  4. Sass J., Mazur K., Eichhorn F., Strupinski W., Turos A., and Schell N. (2005) Determination of In concentration in InGaAs/GaAs 001 epilayers in the early stage of anisotropic stress relaxation. Journal of Alloys and Compounds 401, 249-253.

  5. Paula A. S., Mahesh K. K., Braz Fernandes F. M., Martins R., Cardoso A. M. A., and Schell N. (2005) In-situ high temperature texture chararcterisation in NiTi shape memory alloy using synchrotron radiation. Materials Science Forum 495-497, 125-130.

  6. Paula A. S., Canejo J. P. H. G., Schell N., and Braz Fernandes F. M. (2005) Structural evolution on thermal cycling in Ti-rich NiTi SMA. Nuclear Instruments and Methods in Physics Research B 238, 111-114.

  7. Meduna M., Novák J., Falub C. V., Chen G., Bauer G., Tsujino S., Grützmacher D., Müller E., Campidelli Y., Kermarrec O., Bensahel D., and Schell N. (2005) High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods. Journal of  Physics D: Applied Physics 38, A121-A125.

  8. Martins R. M. S., Schell N., Silva R. J. C., and Braz-Fernandez F. M. (2005) Structural in situ studies of shape memory alloy (SMA) Ni-Ti thin films. Nuclear Instruments and Methods in Physics Research B 238.

  9. Krause-Rehberg R., Bondarenko V., Thiele E., Klemm R., and Schell N. (2005) Determination of absolute defect concentrations for saturated positron trapping - deformed polycrystalline Ni as a case study. Nuclear Instruments and Methods in Physics Research B 240, 719-725.

  10. El-Rahman A. M. A., El-Hossary F. M., Prokert F., Negm N. Z., Schell N., Richter E., and Möller W. (2005) In-situ stability study of nitrocarburized 304 stainless steel during heating. Surface and Coating Technology 200, 602-607.

  11. Eichhorn F., Gaca J., Heera V., Schell N., Turos A., Weishart H., and Wojcik M. (2005) Structural studies on ion-implanted semiconductors using x-ray synchrotron radiation: Strain evolution and growth of nanocrystals. Vacuum 78, 303-309.

  12. Cantelli V., Borany J. v., Mücklich A., and Schell N. (2005) Investigation of the formation and phase transition of small Ge and Co nanoparticles in a SiO2 matrix. Nuclear Instruments and Methods in Physics Research B 238, 268-271.

  13. Beckers M., Schell N., Martins R. M. S., Mücklich A., and Möller W. (2005) In-situ x-ray diffraction studies concerning the influence of AI concentration on the texture development during sputter deposition of Ti-AI-N thin films. Journal of Vacuum Science and Technology A 23, 1384-1391.

  14. Beckers M., Schell N., Martins R. M. S., Mücklich A., and Möller W. (2005) The influence of the growth rate on the preffered orientation of magnetron sputtered Ti-AI-N thin films studied by in-situ x-ray diffraction. Journal of Applied Physics 98, 044901.

  15. Andreasen K. P., Bottiger J., Chevallier J., and Schell N. (2005) Real time in-situ diagnostics of PVD growth using synchrotron radiation. Surface and Coating Technology 200, 1-6.

  16. Almtoft K. P., Bottiger J., Chevallier J., Schell N., and Martins R. M. S. (2005) Influence of the substrate bias on the size and thermal stability of grains in magnetron-sputtered nanocrystalline Ag films. Journal of Materials Research 20, 1070-1080.

2004

  1. Turos A., Gaca J., Wojcik M., Nowicki L., Ratajczak R., Groetzschel R., Eichhorn F., and Schell N. (2004) Virtues and pitfalls in structural analysis of compound semiconductors by the complementary use of RBS/channeling and high resolution x-ray diffraction. Nuclear Instruments and Methods in Physics Research B 219-220, 618-625.

  2. Rogozin A., Shevchenko N., Vinnichenko M., Prokert F., Cantelli V., Kolitsch A., and Möller W. (2004) Real-time evolution of the indium tin oxide film properties and structure during annealing in vacuum. Applied Physics Letters 85, 212-214.

  3. Pelka J. B., Andrejczuk A., Reniewicz H., Schell N., Krzywinski J., Sobierajski R., Wawro A., Zytkiewicz Z., Klinger D., and Juha L. (2004) Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser. Journal of Alloys and Compounds 382, 264-270.

  4. Paula A. S., Canejo J. P. H. G., R.M.S. M., and Braz Fernandes F. M. (2004) Effect of thermal cycling on the transformation temperature ranges of a Ni-Ti shape memory alloy. Materials Science and Engineering A A 378, 92-96.

  5. Martins R. M. S., Silva R. J. C., Braz Fernandes F. M., Pereira L., Gordo Paulo R., Maneira M. J. P., and Schell N. (2004) In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films. Materials Science Forum 455-456, 342-345.

  6. Grosse M., Kalkhof D., Keller L., and Schell N. (2004) Influence parameters of martensitic transformation during low cycle fatigue for steel AISI 321. Physica B 350, 102-106.

  7. Dieter S., Pyzalla A., Bauer A., Schell N., McCord J., Seemann K., Wanderka N., and Reimers W. (2004) Correlation between magnetic properties of CoFe single and CoFe/SiO2 multi-layer thin films and their microstructure, texture and internal stress state. Zeitschrift für Metallkunde 95, 164-175.

  8. Andreasen K. P., Schell N., Jensen T., Petersen J. H., Jensen M. S., Chevallier J., and Bøttiger J. (2004) On the development of the <111> fiber texture in nanocrystalline gold during growth and annealing. Materials Research Society Symposium Proceedings 788, 49-54.

  9. Andreasen K. P., Jensen T., Petersen J. H., Chevallier J., Bøttiger J., and Schell N. (2004) The structure and the corresponding mechanical properties of magnetron sputteed TiN-Cu nanocomposites. Surface and Coating Technology 182, 268-275.

  10. Abendroth B., Gago R., Eichhorn F., and Möller W. (2004) X-ray diffraction study of stress relaxation in cubic boron nitride films grown with simultaneous medium-energy ion bombardment. Applied Physics Letters 85, 5905-5907.

2003

  1. Sztucki M., Metzger T. H., Milita S., Berberich F., Schell N., Rouvière J. L., and Patel J. (2003) Depth resolved investigations of boron implanted silicon. Nuclear Instruments and Methods in Physics Research B 200, 52-59.

  2. Schell N., Petersen J. H., Bøttiger J., Mücklich A., Chevallier J., Andreasen K. P., and Eichhorn F. (2003) On the development of texture during growth of magnetron-sputtered CrN. Thin Solid Films 426, 100-110.

  3. Schell N., Jensen T., Petersen J. H., Andreasen K. P., Bøttiger J., and Chevallier J. (2003) The nanostructure evolution during and after magnetron deposition of Au films. Thin Solid Films 441, 96-103.

  4. Schell N., Bøttiger J., Matz W., and Chevallier J. (2003) Growth mode and texture development in TiN films during magnetron sputtering - an in situ synchrotron radiation study. Nuclear Instruments and Methods in Physics Research B 199, 133-138.

  5. Rinderknecht J., Prinz H., Kammler T., Schell N., Zschech E., Wetzig K., and Gessner T. (2003) In situ high temperature synchrotron radiation diffraction studies of silicidation processes in nanoscale Ni layers. Microelectronic Engineering 70, 226-232.

  6. Prokert F., Schell N., and Gorbunov A. (2003) Use of anomalous scattering for synchrotron x-ray reflectivity studies of Fe-Cr and Co-Cu double layers. Nuclear Instruments and Methods in Physics Research B 199, 123-127.

  7. Linss V., Halm T., Hoyer W., Richter F., and Schell N. (2003) Analysis of the biaxial strain state of Al-doped c-BN films using diffraction experiments with synchrotron radiation. Vacuum 70, 1-9.

  8. Berberich F., Matz W., Kreißig U., Schell N., and Mücklich A. (2003) Mechanism of degradation of surface hardening at elevated temperature in TiAlV-alloys by in situ synchrotron radiation diffraction. Nuclear Instruments and Methods in Physics Research B 199, 54-58.

2002

  1. Zhong Z., Ambacher O., Link A., Holy V., Stangl J., Lechner R. T., Roch T., and Bauer G. (2002) Influence of GaN domain size on the electron mobility of two-dimensional electron gases in AlGaN/GaN heterostructures determined by x-ray reflectivity and diffraction. Applied Physics Letters 80, 3521-3523.

  2. Turos A., Gaca J., Wojcik M., Stonert A., and Groetzschel R. (2002) Strain and compositional profile determination in ion bombarded heterostructures by the complementary use of RBS/channeling and high resolution x-ray dffraction. Nuclear Instruments and Methods in Physics Research B 190, 565-569.

  3. Thiele E., Bretschneider J., C. B., Schell N., Schwab A., and Holste C. (2002) Internal strains in single grains of fatigued polycrystalline nickel. Materials Science Forum 404-407, 823-828.

  4. Schubert C., Kaiser U., Hedler A., Wesch W., Gorelik T., Glatzel U., Kräußlich J., Wunderlich B., Heß G., and Goetz K. (2002) Nanocrystal formation in SiC by Ge ion implantation and subsequent thermal annealing. Journal of Applied Physics 91, 1520-1524.

  5. Schell N., Matz W., Bøttiger J., Chevallier J., and Kringhøj P. (2002) Development of texture in TiN films by use of in situ synchrotron x-ray scattering. Journal of Applied Physics 91, 2037-2044.

  6. Rinderknecht J., Prinz H., Kammler T., Berberich F., and Zschech E. (2002) In situ high temperature synchrotron radiation diffraction studies of Ni and Co-Ni silicidation processes. Microelectronic Engineering 64, 143-149.

  7. Prokert F., Noetzel J., Schell N., Wieser E., and Gorbunov A. (2002) Effect of annealing on the interface structure of cross-beam pulsed laser deposited Co/Cu multilayers. Thin Solid Films 416, 114-121.

  8. Pfeiffer F., Salditt T., and David C. (2002) Reflection of waveguided x-rays in two-dimensional nanostructures. Journal of Applied Crystallography 35, 430-433.

  9. Pfeiffer F., Mennicke U., and Salditt T. (2002) Waveguide-enhanced scattering from thin biomolecular films. Journal of Applied Crystallography 35, 163-167.

  10. Pathak A. P., Nageswara Rao S. V. S., Avasthi D. K., Siddiqui A. M., Srivastava S. K., Eichhorn F., Grötzschel R., Schell N., and Turos A. (2002) Ion beam studies of strains/defects in semiconductor multilayers. AIP Conference Proceedings 680, 593-596.

  11. Klemm R., Thiele E., Holste C., Eckert J., and Schell N. (2002) Thermal stability of grain structure and defects in submicrocrystalline and nanocrystalline nickel. Scripta Materialia 46, 685-690.

  12. Eichhorn F., Schell N., Mücklich A., Metzger H., Matz W., and Kögler R. (2002) Structural relation between Si and SiC formed by carbon implantation. Journal of Applied Physics 91, 1287-1292.

  13. Bøttiger J., Chevallier J., Petersen J. H., Schell N., Matz W., and Mücklich A. (2002) Observation of the growth mode of TiN during magnetron sputtering using synchrotron radiation. Journal of Applied Physics 91, 5429-5433.

2001

  1. Schweitz K. O., Chevallier J., Bøttiger J., Matz W., and Schell N. (2001) Hardness in Ag/Ni, Au/Ni and Cu/Ni multilayers. Philosophical Magazine A 81, 2021-2032.

  2. Schell N., Matz W., Prokert F., Eichhorn F., and Berberich F. (2001) Synchrotron radiation studies of thin films and implanted layers with the materials research endstation of ROBL. Journal of Alloys and Compounds 328, 105-111.

  3. Prokert F., Noetzel J., Schell N., Wieser E., Matz W., and Gorbunov A. (2001) Reflectivity and diffraction study of cross-beam pulsed laser deposited Co/Cu multilayers. Thin Solid Films 394, 164-173.

  4. Prokert F., Gorbunov A., and Schell N. (2001) Ausnutzung der anomalen Streuung bei Reflektivitätsuntersuchungen an Fe-Cr-Doppelschichten mittels Synchrotronstrahlung. Zeitschrift für Kristallographie, 100.

  5. Matz W., Schell N., Neumann W., Bøttiger J., and Chevallier J. (2001) A two magnetrons sputter deposition chamber for in situ observation of thin film growth by synchrotron radiation scattering. Review of Scientific Instruments 72, 3344-3348.

  6. Holý V., Stangl J., Springholz G., Pinczolits M., and Bauer G. (2001) High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices. Journal of Physics D: Applied Physics 34, A1-A5.

  7. Hecker M., van Loyen L., Tietjen D., Schell N., and Schneider C. M. (2001) Influence of annealing on structural properties of metallic multilayers. Materials Science Forum 378-381, 370-375.

  8. Berberich F., Matz W., Kreißig U., Schell N., Richter E., and Möller W. (2001) Structural characterisation of hardening of Ti-Al-V alloys after nitridation by plasma immersion ion implantation. Applied Surface Science 179, 13-19.

  9. Bauer A., Reischauer P., Kräußlich J., Schell N., Matz W., and Goetz K. (2001) Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters. Acta Cryst A57, 60-67.

  10. Arnault J. C., Knoll A., Smigiel E., and Cornet A. (2001) Roughness fractal approach of oxidised surfaces by AFM and diffuse x-ray reflectometry measurements. Applied Surface Science 171, 189-196.

2000

  1. Thiele E., Hecker M., and Schell N. (2000) Change of internal strains in ultrafine-grained nickel due to cyclic plastic derformation. Materials Science Forum 321-324, 598-603.

  2. Thiele E., Bretschneider B., Hollang L., Schell N., and Holste C. (2000) Influence of thermal treatment and cyclic plastic deformation on the defect structure in ultrafine-grained nickel. In Investigations and Applications of Severe Plastic Deformation (ed. T. C. Lowe and R. Z. Valiev), pp. 173-178. Kluwer Academic Publishers.

  3. Pfeiffer F., Salditt T., Høghøj P., Anderson I., and Schell N. (2000) X-ray waveguides with multiple guiding layers. Physical Review B 62, 16939-16943.

  4. Noetzel J., Rössler U. K., Tselev A., Prokert F., Eckert D., Müller K.-H., Wieser E., and Möller W. (2000) Preparation of granular Co/Cu by ion-beam mixing of laser-deprsited multilayer. Applied Physics A: Materials Science & Processing A71, 105-107.

  5. Mattern N., Hecker M., Fischer D., Wenzel C., Schell N., Matz W., Engelmann H., and Zschech E. (2000) Structure characterization of Ta-N barrier layers. Microelectronics Reliability 40, 1765-1770.

  6. Heß G., Bauer A., Kräußlich J., Fissel A., Schröter B., Richter W., Schell N., Matz W., and Goetz K. (2000) Si/Ge-nanocrystals on silicon carbide. Thin Solid Films 380, 86-88.

  7. Hecker M., Tietjen D., Prokert F., Schell N., and Schneider C. M. (2000) Investigation of Co/Cu/NiFe-multilayers by x-ray reflectometry and diffraction. Mikrochim. Acta 133, 239-241.

  8. Berberich F., Matz W., Richter E., Schell N., Kreißig U., and Möller W. (2000) Structural mechanisms of the mechanical degradation of Ti-Al-V alloys: in-situ study during annealing. Surface and Coatings Technology 128-129, 450-454.

1999

  1. Matz W., Schell N., Bernhard G., Prokert F., Reich T., Claußner J., Oehme W., Schlenk R., Dienel S., Funke H., Eichhorn F., Betzl M., Pröhl D., Strauch U., Hüttig G., Krug H., Neumann W., Brendler V., Reichel P., Denecke M. A., and Nitsche H. (1999) ROBL - a CRG Beamline for Radiochemistry and Materials Research at the ESRF. Journal of Synchrotron Radiation 6, 1076-1085.

  2. Eichhorn F., Schell N., Matz W., and Kögler R. (1999) Strain and SiC particle formation in silicon implanted with carbon ions of medium fluence studied by synchrotron x-ray diffraction. Journal of Applied Physics 86, 4184-4187.