Experimental Setup and Equipment

1. Ferromagnetic Resonance - FMR

• in-house development
• Agilent E8364B Vector Network Analyzer:
  Frequency range 0.05 - 50 GHz
• Bruker Electromagnet: max. 2.2 T
• polar and azimuthal sample rotation
• Helmholtz magnet: max 0.1 T

Responsible: K. Lenz⁽¹⁸⁾

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2. Temperature variable Ferromagnetic Resonance

• Attocube Attodry 1000 closed cycle cryostat
  
  • 5 T split-coil magnet
  • temperature range 4 - 300 K
• Agilent N5225A Vector Network Analyzer:
  Frequency range 0.05 - 50 GHz
• full polar and azimuthal sample rotation
• SMU for resistancd and magnetoresistance measurements

Responsible: K. Lenz⁽²⁰⁾

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3. Microresonator Ferromagnetic Resonance

• in-house development
• microwave bridge
  Frequency range 4-40 GHz
• Bruker Electromagnet: max. 2.2 T
• azimuthal sample rotation
• field modulation/Lock-in detection

Responsible: K. Lenz⁽²²⁾

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4. Brillouin-Lichtstreumikroskop 1+2

• in-house development
• BLS1: Phase- and time resolved
  BLS2: time resolved only
• Tandem Fabry-Perot interferometer TFP-2 HC by JRS Scientific Instruments
• Sample positioning by XM Ultra-Precision Linear Motor Stages von Newport
• 50x and 100x objectives
• Magnet field up to 0.9 T
• Time resolution: down to 30ps using TimeTagger 20 from Swabian Instruments
• GSG Picoprobes for microwave input
• RF excitation up to 40 GHz, 30 dBm max.
• DC excitation by SMU
• arbitrary and pulse pattern generator

Responsible: H. Schultheiss⁽²⁴⁾

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5. Time-Resolved Magneto-Optical Kerr Effect

• in-house development
• Delay time up to 5 ns
• Feld: max. 1 T
• Femtolasers XL500
• Wavelength: 800 nm
• Pulse-Length 40 fs
• Repetition rate: 5 MHz
• Output Power: 2.6 W
• Energy: 500 nJ/pulse

Responsible: H. Schultheiß

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6. Magneto-Optical Kerr Effect - MOKE

• in-house development
• longitudinal and transversal Kerr effect
• Field (in-plane): max. 400 Oe (Helmholtz coils)
• x, y, f scanning capabilities
• Temperature range: RT – 600 K

Responsible: H. Schultheiß

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7. Kerr-Microscopy

• Manufacturer: Evico-Magnetics
• Microscope: Zeiss Axio Imager.D1m
• Light Source: two high-power LEDs (blue+red)
• Bipolar and quadrupol magnet
• twin-color system for quantitative Kerr analysis
• integrated AMR measurement

Responsible: H. Schultheiß

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8. Probe Station for Nanostructures

• Süss MicroTech PM5 Wafer Prober
• Süss Z-Probes: GSG 0-50 GHz, 150µm Pitch
• Evico Magnetics electromagnet: B_max= 0.6 T
• Optem CCD-Microscope
• Agilent MXA spectrum analyzer
• Picosecond PulseLab pulser
• Tektronix DPO72004 20GHz real-time oscilloscope
• Keithley source meter

Responsible: K. Lenz

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9. Frequency-resolved MOKE

• optically detected FMR (5 µm spatial resolution)
• Magnetic field up to 1.4 T
• Kepco power supply
• Frequency range up to 35 GHz

Responsible: K. Lenz⁽²⁹⁾

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10.  Atomic and Magnetic Force Microscope (AFM/MFM)

• Veeco/DI Multimode
• sample size: 10 x 10 mm²
• scan area max. 100x100 µm²
• scan area 15x15 µm²
• magnetic field 0 - 40 mT
• resolution:
  • AFM ~10 nm
  • MFM ~30 nm
• Scanning Spreading Resistance Microscopy (SSRM) option

 Responsible: K. Potzger⁽³¹⁾

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11. Atomic Force Microscope (AFM/MFM)

• Bruker Icon Dimension
• sample size: up to 20 x 20 cm²
• scan area max. 100 x 100 µm²
• AFM: ScanAsyst mode, tapping mode, contact mode
• MFM: lifted mode
• resolution: ~1nm

Responsible: K. Potzger

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12. Electric prober for phase change materials

• temperature and magnetic field dependence of resistance
• sample size: 10 x 10 mm²
• temperature RT - 450 K
• field: 1 kOe in-plane
• base pressure < 1e-6 mbar

Responsible: K. Potzger⁽³³⁾

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13. Vibrating Sample Magnetometer - VSM

• magnetic field max. ±1.8 T
• sensitivity: 5x10^-6 emu (0.8x10^-6 rms noise)
• angular range 360°
• vector coil option
• room temperature

responsible: R. Salikhov⁽³⁵⁾