SEM-Laboratory
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Beschreibung |
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SEM Zeiss EVO 50
- Tungsten cathode
- Acceleration voltage 0.2 - 30 kV
- Resolution: 3 nm at 30 kV
- Detectors:
- Everhart-Thornley secondary electron detector
- 4 quadrant backscatter electron detector
- Chamber: diameter: 365 mm; high: 255 mm
- 5-Axes motorised compucentric specimen stage
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EDX: Bruker AXS QUANTAX 200
- Light element detector X-Flash 4010
- Energy resolution 127 eV
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Cressington DUAL Coating System 108a/c
- Cressington 108auto sputter coater ( → thin layer of gold)
- Cressington 108carbon/A carbon coater ( → thin layer of carbon)
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Application fields
- Fractography of unirradiated and irradiated specimens of reactor pressure vessel steels and other materials
- Characterization of surface structures of different materials
- Visualization and element analysis of insulation debris and corrosion products for investigation of chemical effects during LOCA incidents in NPP
- Investigation of bacteria and biofilms
- EBSD on SEM Zeiss NVision 40 with Bruker e-FlashHR- detector and QUANTAX CrystAlign EBSD-system
URL of this article
https://www.hzdr.de/db/Cms?pOid=23598
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