Contact

Dr. Stefan Facsko
Head IBA/OSA
Head Ion Induced Nanostructures
s.facskoAthzdr.de
Phone: +49 351 260 - 2987
Fax: 12987, 2879

Structure Diagnostics

The Division of Structure Diagnostics is mainly engaged in investigations of the microstructure of ion-implanted materials. Thematically, it is integrated into the research work of the other departments of the institute and thus oriented on the basis of the used methods.


TEM FWIS

Methods available in Structure Diagnostics

The equipment is significantly used for investigations of samples from other institutes of the HZDR. The specific sample preparation (especially for electron microscopy) is performed in the department.


Topics of the investigation

Methods

Phase analysis/ phase formation and lattice disortion in layer structures MB, TEM, XRD
Structure of thin films and their interfaces SEM, TEM, XRD, XRR
Element composition in microregions AES, EDX at SEM and TEM
Surface and interface roughness TEM, XRR

Contact

Dr. Stefan Facsko
Head IBA/OSA
Head Ion Induced Nanostructures
s.facskoAthzdr.de
Phone: +49 351 260 - 2987
Fax: 12987, 2879