Contact

Dr. Jürgen Lindner
Head
Magnetism
j.lindnerAthzdr.de
Phone: +49 351 260 - 3221

News

Conferences/workshops

  • DPG Regensburg, 6.-11.3.2016
    • Deadline Registrierung: 1.12.2015
  • 603. WEH Seminar Magnonics 6.-8.1.2016
  • Joint MMM-Intermag 13, San Diego, USA, 11.-15.1.2016

Bachelor/master theses

FWIN calendar

Lectures

Safety training

Instrumentelle Ausstattung und Geräte


Bitte wenden Sie sich bei Interesse an Experimenten unter Benutzung dieser Geräte an die genannten Verantwortlichen.


Thin Film Deposition

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 K1 Sputterchamber

K1: sputter chamber for metal and oxide/nitride thin films

  • 2" targets
  • temperature range: RT - 1100 °C
  • gas control: 0.1 - 200 sccm
  • base pressure: <1e-7 mbar
  • sample size: up to 50 x 50 mm²

Responsible: K. Potzger

Neue MBE+FIB Kammer

ALDI: apparatus for layer deposition and interfaces

  • Manufacturer: Createc
  • MBE:
    • 5 pocket e-beam evaporator
    • 4 Knudsen cells
    • EFM3 evaporator
  • Ion source: Model Kremer IQ100
  • Plasma source
  • LEED
  • AES
  • sample size 10 x 10 mm²

Responsible: K. Potzger

 Sputnik Chamber

Sputnik: sputter chamber

  • sample size 10 x 10 mm²
  • temperature range: RT - 1000 °C
  • 2 targets
  • base pressure 1e-10 mbar
  • sputter pressure 3e-3 mbar at 43 sccm Argon

Responsible: K. Potzger


Magnetometry

 1. Superconducting Quantum Interference Device - SQUID
 2. Ferromagnetic Resonance - FMR
 3. Low temperature Ferromagnetic Resonance
 4. Microreosnator Ferromagnetic Resonance
 5. Time-Resolved Magneto-Optical Kerr Effect
 6. Magneto-Optical Kerr Effect - MOKE
 7. Kerr Microscopy
 8. Probe Station for Nanostructures
 9. Probe Station for Spintranfer Torque
10. Frequency-resolved MOKE for optically detected FMR
11. Atomic & Magnetic for Microscope
12. Electric Prober for Phase Change Materials
13. Mössbauer Spectroscopy


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SQUID magnetometer

1. Superconducting Quantum Interference Device - SQUID

  • Type: Quantum Design MPMS
  • Field: max. 7 T
  • Temperature range: 1.9 – 400 K
  • Sensitivity: < 10-8 emu

Responsible: K. Potzger

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FMR

2. Ferromagnetic Resonance - FMR

  • in-house development
  • Agilent E8364B Vector Network Analyzer:
    Frequency range 0.05 - 50 GHz
  • Bruker Electromagnet: max. 2.2 T
  • polar and azimuthal sample rotation
  • Helmholtz magnet: max 0.1 T

Responsible: K. Lenz

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Cryo-FMR

3. Low Temperature Ferromagnetic Resonance

  • Attocube Attodry 1000 closed cycle cryostat
    • 5 T split-coil magnet
    • temperature range 4 - 300 K
  • Agilent N5225A Vector Network Analyzer:
    Frequency range 0.05 - 50 GHz
  • full polar and azimuthal sample rotation

Responsible: K. Lenz

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Microresonator-FMR

4. Microresonator Ferromagnetic Resonance

  • in-house development
  • microwave bridge
    Frequency range 8-16 GHz
  • Bruker Electromagnet: max. 2.2 T
  • azimuthal sample rotation
  • field modulation/Lock-in detection

Responsible: K. Lenz

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TR-MOKE Setup

5. Time-Resolved Magneto-Optical Kerr Effect

  • in-house development
  • Delay time up to 5 ns
  • Feld: max. 1 T
  • Femtolasers XL500
  • Wavelength: 800 nm
  • Pulse-Length 40 fs
  • Repetition rate: 5 MHz
  • Output Power: 2.6 W
  • Energy: 500 nJ/pulse

Responsible: H. Schultheiß

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Instrumentation MOKE

6. Magneto-Optical Kerr Effect - MOKE

  • in-house development
  • longitudinal and transversal Kerr effect
  • Field (in-plane): max. 400 Oe (Helmholtz coils)
  • x, y, f scanning capabilities
  • Temperature range: RT – 600 K

Responsible: H. Schultheiß

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Kerr-Mikroskop

7. Kerr-Microscopy

  • Manufacturer: Evico-Magnetics
  • Microscope: Zeiss Axio Imager.D1m
  • Light Source: two high-power LEDs (blue+red)
  • Bipolar and quadrupol magnet
  • twin-color system for quantitative Kerr analysis
  • integrated AMR measurement

Responsible: J. Osten

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PM5

8. Probe Station for Nanostructures

  • Süss MicroTech PM5 Wafer Prober
  • Süss Z-Probes: GSG 0-50 GHz, 150µm Pitch
  • Evico Magnetics electromagnet: Bmax= 0.6 T
  • Optem CCD-Microscope
  • Agilent MXA spectrum analyzer
  • Picosecond PulseLab pulser
  • Tektronix DPO72004 20GHz real-time oscilloscope
  • Keithley source meter

Responsible: A. Deac

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STT-Meßplatz

9. Probe Station for Spintransfer Torque

  • Magnetic field up to ca. 1.5 T
  • Tilting sample holder: in-plane and out-of-plane-magnetic fields possible
  • GGB Picoprobes (40 GHz)
  • Agilent Technologies PXA 50 GHz Signal Analyzer
  • Agilent MXG 40 GHz Analog Signal Generator
  • LakeShore 425 Gaussmeter
  • Keithley 2182A Nanovoltmeter
  • Keithley 6221 Current Source
  • Kepco Power Supply

Responsible: A. Deac

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FR-MOKE Setup für optisch detektierte FMR

10. Frequency-resolved MOKE

  • optically detected FMR (5 µm spatial resolution)
  • Magnetic field up to 1.4 T
  • Kepco power supply
  • Frequency range up to 35 GHz

Responsible: K. Lenz

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AMF/MFM 

11.  Atomic and Magnetic Force Microscope (AFM/MFM)

  • Veeco/DI Multimode
  • sample size: 10 x 10 mm²
  • scan area max. 100x100 µm²
  • scan area 10x10 µm²
  • magnetic field 0 - 65 mT
  • resolution:
    • AFM ~10 nm
    • MFM ~30 nm
  • Scanning Spreading Resistance Microscopy (SSRM) option

 Responsible: K. Potzger

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12. Electric prober for phase change materials

  • temperature and magnetic field dependence of resistance
  • sample size: 10 x 10 mm²
  • temperature RT - 450 K
  • field: 1 kOe in-plane
  • base pressure < 1e-6 mbar

Responsible: K. Potzger

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 Mössbauer Setup

13. Mössbauer spectroscopy

for charge state, quadrupole splitting, hyperfine field of Fe containing materials

  • conversion electron spectroscopy for thin films
  • transmission spectroscopy for powders
  • max. sample size: 2x2 cm²
  • room temperature measurements
  • source: 57Co

Responsible: K. Potzger

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Material analysis

1. AIDA I: Apparatus for in-situ defect analysis
2. AIDA II: Apparatus for in-situ defect analysis
3. Climate Simulation Chamber


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 AIDA - Apparatus for in-situ defect analysis

1. AIDA 1: Apparatus for In-situ Defect Analysis

in-situ Doppler broadening spectroscopy at SPONSOR

  • sample size: 10 x 10 x 0.5 mm
  • base pressure 10e-8 mbar
  • temperature range: 50 - 1200 K
  • Ar ions up to 5 keV
  • positron beam:
    • 22Na source
    • 30 eV - 36 keV
  • 2 Germanium detectors
  • 4-point probe resistometer

Responsible: K. Potzger

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2. AIDA 2: Apparatus for In-situ Defect Analysis

in-situ irradiation, NRA and XPS of metallic thin films and PAS

  • Prevac
  • sample size: 10 x 10 x 0.5 mm
  • base pressure: 10e-8 mbar/10e-10 mbar at XPS chamber
  • temperature range: 50 - 1200 K
  • ions: noble gases, N, O, H at 2 and 30 keV
  • deposition: Prevac ebeam
  • high pressure: 20 bar Prevac Flow Through reactor
  • XPS:
    • 20 meV resolution at 20 eV pass energy and 450 eV kinetic energy
    • X-Ray source (Al)
    • Prevac Twin-source (Al/Mg)
    • monochromators (3 crystals)
  • Ion source for depth profiling
  • flood gun for insulators
  • nuclear reaction analysis unsing 15N from IBC

Responsible: K. Potzger

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3. Climate simulation chamber

for corrosion testing

  • Vötsch Industrietechnik
  • 190 liter volume
  • max. temperature range: -72 to +180 °C
  • climate simulations: +10 - 95 °C
  • humidity: 10 - 98 % rel.
  • dew point: -3°C - 94 °C
  • computer controlled temperature and humidity ramps

Responsible: K. Potzger

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