Contact

Dr. Stefan Facsko
Head IBA/OSA
Head Ion Induced Nanostructures
s.facskoAthzdr.de
Phone: +49 351 260 - 2987
Fax: 12987, 2879

Ion Beam / Structure Analysis

The project group Ion Beam / Structure Analysis is concerned with the analysis of the chemical, physical, and morphological properties of (ion-modified) solid surfaces and thin films. The analytical methods make use of the interaction of high-energy ions, electrons, and X-ray beams with solid surfaces.


Topics

  • Element and structure analysis of thin films and at surfaces
  • Micro / nanoscale analysis
  • In situ analysis during film deposition / thermal processes
  • Phase formation and transformations / lattice properties
  • Characterization of interfacial and surface morphology
  • Non-destructive analysis of art and cultural objects
  • Resource analysis (in cooperation with the Helmholtz Institute for Resource Technology - HIF)

Available analysis technologies

Browne-Buechner-Spektometer_ausschnitt Ion Beam Analysis
  • Rutherford backscattering spectrometry (RBS)
  • Nuclear recoil spectrometry (ERDA)
  • Nuclear resonance reaction analysis (NRA)
  • Proton-induced X-ray and gamma-ray spectroscopy (PIXE / PIGE)
  • Accelerator mass spectrometry (AMS) - in cooperation with HIF
TEM FWIS Structure Diagnostics
  • Analytical transmission and scanning electron microscopy (TEM / SEM)
  • Analysis with dual-beam systems (ion / electron)
  • Auger electron spectroscopy (AES)
  • Moessbauer spectroscopy
  • X-ray diffraction (XRD) / reflectometry (XRR) / small-angle scattering (GISAXS)

Contact

Dr. Stefan Facsko
Head IBA/OSA
Head Ion Induced Nanostructures
s.facskoAthzdr.de
Phone: +49 351 260 - 2987
Fax: 12987, 2879