Contact

Prof. Jens Gutzmer
Director
Helmholtz Institute Freiberg for Resource Technology
Head of Analytics

Phone: +49 351 260 - 4400
Fax: +49 351 260 - 4440

Dr. Axel Renno
Group Leader Ion Beam Analysis 
Phone: +49 351 260 - 3274

Division of Analytics - Equipment

Geoscientists at the Helmholtz Institute Freiberg for Resource Technology apply microanalytical methods to solve a wide range of scientific questions. They are used to determine chemical, crystallographic or structural parameters in situ and almost non-destructive at the highest possible lateral resolution.


Methods of chemical elements' analysis with enhanced detection limits from left to right (white = in operation; yellow = under construction)

Methods of chemical elements' analysis with increasing detection limits from left to right (white = in operation; yellow = under construction)

Overview of all quantitative and qualitative analysis methods at HIF

Method

Spatial resolution

Detection limits

Key features

Contact

Polarisation Microscopy

(Zeiss Imager 2 m)

10 - 30 µm

(semi­quantitative)

  • fast
  • preparation tool for local analytics

Dr. Joachim Krause
Dr. Axel Renno

XRF

X-Ray Fluorescence
(Panalytical Axiosmax)

low

2 x 10-5 - 1 x 10-6 g/g (P - U)

  • fast

Dr. Robert Möckel
Anne Rahfeld

SEM

Scanning Electron Microscopy
(Quanta 650 FEG-MLA600F)

10 nm  
  • imaging technique only

Kai Bachmann
Thomas Heinig
Sabine Haser

MLA

Mineral Liberation Analysis
(FEI)

1 µm

10-3 g/g (B - U)

  • mineral composition
  • microtexture

Kai Bachmann
Thomas Heinig
Sabine Haser

P-XRD

Powder X-Ray Diffraction
(Panalytical Empyrean)

low 0,2 - 3 %
  • mineral composition
  • structural refining

Dr. Robert Möckel
Anne Rahfeld

HS-PIXE

High Speed Particle Induced X-ray Emission
(unique, IfG/ IBC)

~ 10 x 10 µm2 ~ 10-5 g/g (Na - U)
  • ultrafast chemical information

Dr. Axel Renno
Dr. Silke Merchel

EPMA

Electron Probe Micro Analysis
(JEOL JXA-8530F)

0,5 µm

5 x 10-4 - 1 x 10-5 g/g (Be - U)

  • high resolution
  • chemical mapping
Dr. Joachim Krause

LA-ICP-MS

Laser Ablation Inductively
Coupled Plasma Mass Spectrometry
(Perkin Elmer NEXION 300)

5 - 100 µm

10-5 - 1 x 10-8 g/g (Li - U)

  • fast
  • low Detection limits
  • under construction!
Dr. Joachim Krause

Ion microprobe

(unique, Ion beam center)

3 x 3 µm2

2 x 10-3 atom/ atom (H, B - F)

> 1 x 10-5 atom/ atom (Al - U)

  • depth resolution ~ 20 nm
  • standard-free

Dr. Axel Renno
Dr. Silke Merchel

AMS

Accelerator Mass Spectrometry
(HVEE, Ion beam center)

low 10-15 atom/ atom
(10Be, 26Al, 36Cl, 41Ca, 129I, ...)
  • radionuclides at lowest detection limits

Dr. Axel Renno
Dr. Silke Merchel

Super-SIMS

Secondary Ion Mass Spectrometry
(unique, Cameca IMS 7f/ Ion beam center)

~ 5 x 5 µm2

~ 10-9 - 10-12 atom/ atom

(all but noble gases)

  • depth resolution ~ 5 nm
  • isotopes

Dr. Axel Renno
Dr. Silke Merchel

Sample preparation

      Andreas Bartzsch