Contact

Dr. Cornelia Heintze
Head Structural Materials
c.heintzeAthzdr.de
Phone: +49 351 260 - 3431

Dr. Falk Röder
Structural Materials
f.roederAthzdr.de
Phone: +49 351 260 - 2720

Analytic TEM FEI Titan 80-300

TEM-Laboratory

FEI Talos F200ADescription
Bild: FEI Talos F200A
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Electron gun

  • Type: X-FEG
  • Acceleration voltage: 200 kV
  • Brightness: 1.8 109 A cm-2 sr -1 (at 200 kV)
  • Total beam current: < 50 nA
  • Probe current (0.3-1.0 nm): 0.4-1.5 nA (at 200 kV)

Imaging performance

  • Objective: A-Twin-lens
  • STEM-detectors: HAADF, BF/DF on-axis
  • TEM information limit: 0.12 nm
  • TEM point resolution: 0.25 nm
  • STEM-HAADF resolution: 0.16 nm

Stage

  • Type: FEI CompuStage
  • Max. goniometer tilt: ± 90º
  • Max. tilt (double tilt holder): ± 30º
  • Piezo-enhanced (x,y): step size > 20 pm

Camera

  • Type: FEI Ceta 16M
  • Scintillator: phosphorous
  • Sensor: 4096 x 4096 CMOS
  • Pixel size: 14 x 14 µm2
  • Speed: < 25 fps (binnig 8)

EDS

  • Type: Super-X EDS system (4 SDD symmetric)
  • Solid angle: 0.9 sr
  • Energy resolution: 136 eV for Mn kα and 10 kcps
  • Pixel dwell time: > 10 µs

Specimen holders for 3.05 mm disks (max. 0.34 mm thickness)

  • Single tilt
  • CompuStage Low-Background, double-tilt specimen holder with hex-ring (Be)
  • High-Visibility Low-Background, double-tilt specimen holder with SoftLoc (Mo or bronze) optimized for minimal EDS-shadowing
  • In-situ Gatan single tilt straining holder (model 654) with Accutroller (model 902)

Fields of reseach

  • Nano-structure evolution in Fe-based bcc alloys induced by ion irradiation
  • Quantitative dislocation imaging and analysis
  • Nano-cluster identification and characterization
  • Imaging of magnetic properties

Methods applied

  • Bright field /dark field imaging
  • Weak beam dark field imaging
  • STEM-BF/ADF/HAADF
  • STEM-EDX
  • Lorentz-Microscopy

Contact

Dr. Cornelia Heintze
Head Structural Materials
c.heintzeAthzdr.de
Phone: +49 351 260 - 3431

Dr. Falk Röder
Structural Materials
f.roederAthzdr.de
Phone: +49 351 260 - 2720