HeFIB Schedule
Monday |
Tuesday |
Wednesday |
|||||||||||
Time |
Title |
Speaker |
Time |
Title |
Speaker |
Time |
Title |
Speaker |
|||||
Break/refreshments |
Analytic |
08:30 |
Thermal Effects from Light Ion Beams in Thin Films |
Notte |
Nanofabrication |
||||||||
Inivted Speaker |
09:00 |
FIB milling strategies for the mitigation of beam-induced artifacts in polymer thin films: He vs. Ga |
Allen |
08:50 |
A revolutionary quantum computer device fabricated from implanted ordered arrays of single donor atoms in silicon | Jamieson | |||||||
Sponsor contribution |
09:20 |
METALLOGRPHY OF THIN FILMS WITH FOCUSED ION BEAMS |
Chiriaev |
09:20 |
Site-controlled Si Nanodot Formation for a RT-SET via Ion Beam Mixing and Phase Separation |
Xu |
|||||||
Other |
09:40 |
Compositional analysis and in situ experiments in the HIM |
Klingner |
09:40 |
Latest development for failure analysis – When ions meet chemistry |
Delobbe |
|||||||
10:00 |
SIMS performed on the Helium Ion Microscope: a unique tool for highest spatial resolution imaging and correlative microscopy |
Wirtz |
10:00 |
Cs ion coldbeam suitability for circuit edit and other nanomachining applications |
Greenzweig |
||||||||
2D Materials |
10:30 |
Welcome |
10:20 |
Coffee |
10:20 |
Coffee |
|||||||
10:40 |
Graphene nano-electro-mechanical (GNEM) devices functionalized by using helium ion beam |
Mizuta |
New imaging approaches |
10:50 |
Transmission He Ion Microscopy |
Kavanagh |
Defects |
10:50 |
Nanoscale defect engineering in ferroelectric thin films by focused ion beam microscopy |
McGilly |
|||
11:10 |
Anderson localization of graphene by sub-nm diameter helium ion beam irradiation |
Ogawa |
11:20 |
Towards observing diffraction in a HIM |
Herrmann |
11:20 |
Defect production in supported two-dimensional materials under ion irradiation from atomistic simulations: the substrate is crucial |
Kretschmer |
|||||
11:30 |
In-situ measurement of electron conduction modulation in graphene by helium ion beam irradiation |
Nakaharai |
11:40 |
Multi-Modal Characterization with Secondary Ion Mass Spectrometry on ZEISS ORION NanoFab |
Casares |
11:40 |
Modification of MoS2 with Helium Ion Beam: Fabrication of Gate-Tunable Memristor |
Keane |
|||||
11:50 |
He-Ion Microscopy Combined with Micromanipulators for Pick & Place, Electrical & Mechanical Characterization, and Other Tasks |
Smith |
12:00 |
Characterising Carbon-based materials in the HIM: probing the invisible with secondary electron spectroscopy |
Abrams |
12:00 |
Application of Gas Field Ion Source to Patterning Nanoscale Magnetic Structures |
Bali |
|||||
12:10 |
Lunch |
12:20 |
Lunch |
12:20 |
Writing Magnetic Domains with a Helium Ion Microscope |
Emmrich |
|||||||
Imaging and Biological applications |
14:00 |
Helium and neon ion microscopy and milling for microbiological applications |
Maasilta |
Lithography |
14:00 |
Understanding Focused Ion Beam Sputtering and Gas-Assisted Etching via the EnvizION Monte Carlo Simulation |
Mahady |
12:40 |
Summary/Outlook |
||||
14:30 |
FIB/SEM Processing of Biological Samples |
Wolff |
14:30 |
Binary Collision Computer Simulation of FIB Induced Erosion and Atomic Mixing in Nanostructures | Möller |
12:50 |
Lunch |
||||||
14:50 |
Correlative Microscopy with Light, Electrons and Ions in Environmental Microbiology |
Schmidt |
14:50 |
Helium Ion Based Lithography of Advanced Resists |
Feldman |
14:30 |
Ion Beam Center @ HZDR tour |
||||||
15:10 |
Comparison of image fusion techniques for ion beam based correlative microscopy |
Vollnhals |
15:10 |
Advanced FIB nanopatterning employing a high precision sample stage |
Bauerdick |
17:00 |
|||||||
15:30 |
Multimodal Imaging for Physical and Chemical Surface Characterization using a Combined Helium Ion Microscope and Secondary Ion Mass Spectrometry Platform |
Ovchinnikova |
15:30 |
Fabrication of Plasmonic Nanostructures by He+ and Ga+ Milling |
Westphal |
||||||||
15:50 |
Coffee |
Excursion and dinner |
|||||||||||
New Ion Beams |
16:20 |
ColdFIB – a new FIB column with a laser cooled source |
Viteau |
||||||||||
16:50 |
New non‐Gallium FIB Alternatives for Nanofabrication |
Mazarov |
|||||||||||
17:10 |
Ion Sources for Focused Ion Beam Applications |
Bischoff |
|||||||||||
17:30 |
Source Shot Noise Mitigation in Helium Ion and Focused Ion Beam Microscopy |
Murray-Bruce |
|||||||||||
17:50 |
The Xe plasma FIB - the other extreme |
Mulders |
|||||||||||
18:10 |
Revolutionary Field Emission Thruster Developments for Nano-satellites at TU Dresden and its correlative LMIS-applications at terrestrial Implanters. |
Laufer |
|||||||||||
18:30 |
Posters |
||||||||||||
20:00 |