Master theses / Diploma theses

Secondary Ion Mass Spectrometry (SIMS) is a microanalytical method with a very good lateral and depth resolution combined with excellent limits of detection as well as a weak degree of destruction.
However, the method is very matrix sensitive and requires matrix adapted reference materials. Actually there are no certified reference materials available for mineralogical studies. Therefore most SIMS labs use so-called ‘in-house ’ standards.
The concentration of trace elements in natural quartzes is a very important quality parameter for the usage of these minerals as a raw material. On the other hand it bears very valuable genetic mineralogical information.
In collaboration with an industrial partner we will use the new method "energy-filter for ion implantation" as a tool for the production of matrix-matched reference materials (RMs) with a homogeneous trace element distribution in all three dimensions. These RMs will be used for SIMS and EPMA purposes.
The thesis project has the following aims:

• Determination of the implantable set of elements by using the available filters
• Calculation of the implantation parameters
• Experimental test of these parameters with selected combinations element – concentration – implantation depth
• Test of the implantation by means of SIMS and EPMA

• You study physics, material's sciences or engineering
• You are interested in mineralogical or analytical problems
• You are interested in modern analytical techniques
• You show initiative and good teamwork skills

Start immediately
project period in accordance withe respective study regulations (est. 6 month)