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Charakterisierung von Oberflächenveränderungen während der Probenvorbereitung (Id 206)

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Foto: High-resolution TEM cross-section perpendicular to a polished cassiterite (SnO2) surface. ©Copyright: Haosheng WuFor many kinds of analytical methods, samples with flat and polished surfaces are requested. During the sample preparation for these requests, the physical or chemical properties of the surface might be affected. It is well known that several minerals develop a very thin amorphous layer on the surface during polishing. Another feature is the formation of dislocations and stacking faults near to the surface (see figure). These different types of alteration will strongly affect the accuracy of surface related measurement result. The aim of the thesis is to understand the influence of each sample preparation procedure on selected types of minerals.
The following analytical methods will be applied: Atomic Force Microscopy (AFM), Scanning Electron Microscope (SEM), and Transmission Electron Microscopy (TEM).

Department: Processing

Contact: Wu, Haosheng, Dr. Rudolph, Martin, Dr. Renno, Axel

Requirements

  • Student of material sciences, mineralogy, crystallography or relevant areas
  • Good spoken and written English or German
  • Enthusiasm for experimental lab. work.
  • Creativity and desire to do new things

Conditions

  • Start: from now
  • Duration: 4-6 months

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