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High-Speed PIXE – a new tool for Automated Mineralogy using a Color X-Ray Camera

Renno, A. D.; Buchriegler, J.; Dressler, S.; Hanf, D.; Merchel, S.; Munnik, F.; Nowak, S.; Scharf, O.; Ziegenrücker, R.

Methods of automated mineralogy form the analytical backbone of geometallurgy. Most of them exploit the combined imaging and analytical capabilities of optical and scanning electron microscopes. Typical results are „phase maps“ either derived from the distribution of major elements or determined directly. The effective application of such methods for strategic metals which are won as by-products from other metal ores or secondary raw materials is handicapped by the restricted possibilities to determine the spatial distribution of such trace elements like In, Ga, Ge or the rare earth elements (REE). The recently commissioned High-Speed PIXE (Particle Induced X-Ray Emission) setup at the Helmholtz-Institute Freiberg for Resource Technologies will overcome these limitations by using the advantages of PIXE over traditional electron beam based methods like the better peak-background ratio. We use the SLcam® Colour X-ray Camera - a novel pnCCD pixel detector (264×264=69696 pixel) combined with a polycapillary X-ray optics (Scharf et al., 2011) as detector for element specific X-ray radiation. This design allows us the simultaneous determination of trace element distributions on a 12 × 12 mm2 area with a lateral resolution better than 100 μm. First results of geometallurgical applications of this method are presented.

Keywords: PIXE; High-Speed PIXE

  • Lecture (Conference)
    92nd Annual Meeting Deutsche Mineralogische Gesellschaft (DMG) 2014, 21.-24.09.2014, Jena, Deutschland

Permalink: https://www.hzdr.de/publications/Publ-20914
Publ.-Id: 20914