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High-Speed PIXE - First results: Laterally resolved trace element maps of geological samples

Buchriegler, J.; Hanf, D.; Merchel, S.; Munnik, F.; Nowak, S. H.; Renno, A. D.; Scharf, O.; von Borany, J.; Ziegenrücker, R.

The so-called “High-Speed PIXE” is a novel combination of the SLcam® [1,2] and proton-induced X-ray emission (PIXE). The fluorescence radiation is excited by 3-4 MeV protons provided by the 6 MV tandem accelerator at HZDR. The pixel-detector comprising 264 x 264 pixels in combination with a polycapillary X-ray optics allows a fast detection of laterally resolved elemental maps over a detection area of 12 x 12 mm² simultaneously for all pixels.
Based on the pixel size of 48 x 48 μm² and considering the Nyquist-Shannon sampling theorem a lateral resolution better than 100 μm should be achievable. By measuring well-known structures of copper and chromium with appropriate dimensions, this assumption could be verified.
The system is intended for the detection of trace elements in geological samples by using a pnCCD-chip with an energy resolution better than 160 eV (@Mn Kα) for each pixel. The distribution of known trace element concentrations (<0.1%) in minerals could be proven in a short measurement time with this new PIXE set-up.
[1] O. Scharf et al., Anal. Chem., Vol. 83, pp. 2532-2538 (2011).
[2] I. Ordavo et al., NIM A, Vol. 654, pp. 250-257 (2011).

  • Poster
    8th International Symposium on BioPIXE, 14.-19.09.2014, Bled, Slovenia

Publ.-Id: 21110