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Diffraction techniques in nuclear materials

Bergner, F.

The presentation is aimed at introducing diffraction techniques and their applications in the field of structural nuclear materials. After a brief introduction, three selected experimental techniques are presented in more detail. These are X-ray line profile analysis (XLPA), electron backscatter diffraction (EBSD) and small-angle neutron scattering (SANS). XLPA is applied to derive microstructure parameters such as crystallite size, dislocation density and twin probability of a nanostructured high-entropy alloy processed by means of high pressure torsion. EBSD is shown to be useful for the characterization of the bainitic microstructure in terms of subunits of the prior austenite grains and their orientation relationship with the parent phase. As an example for the application of SANS, the effects of neutron flux and neutron fluence on the volume fraction and mean size of irradiation-induced solue atom clusters are characterized.

Keywords: Diffraction; Scattering; Nuclear materials; Irradiation effects

  • Invited lecture (Conferences) (Online presentation)
    European School on Nuclear Material Science, 09.-13.11.2020, Online, Online

Permalink: https://www.hzdr.de/publications/Publ-31692
Publ.-Id: 31692


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