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Data publication: In-situ GISAXS observation of ion-induced nanoscale pattern formation on crystalline Ge(001) in the reverse epitaxy regime

Erb, D.; Myint, P.; Evans-Lutterodt, K.; Ludwig, K.; Facsko, S.

experimental raw data: in-situ Grazing Incidence Small Angle X-ray Scattering (GISAXS), ex-situ Atomic Force Microscopy (AFM); simulated raw data: surface topography (RIDO)

Related publications

  • Reseach data in the HZDR data repository RODARE
    Publication date: 2022-12-31
    DOI: 10.14278/rodare.1209
    License: CC-BY-4.0
    Embargo: 31.12.2022

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Permalink: https://www.hzdr.de/publications/Publ-33255
Publ.-Id: 33255