Publications Repository - Helmholtz-Zentrum Dresden-Rossendorf

1 Publication
Electrical characterization of thin SiO2 layers containing Ge / Si nanoclusters
Gebel, T.; von Borany, J.; Rebohle, L.; Skorupa, W.; Thees, H.-J.; Wittmaack, M.; Stegemann, K.-H.;
no abstract delivered from author
  • Poster
    NATO Advanced Study Institute, "Defects in SiO2 and related Dielectrics: Science and Technology", Erice (Sizilien, Italien), 8.-20.04.2000

Publ.-Id: 4863 - Permalink