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Further indication of a low quartz structure at the SiO2/Siinterface from coincidence Doppler broadening spectroscopy
Brauer, G.; Becvar, F.; Anwand, W.; Skorupa, W.;
Results from coincidence Doppler broadening (CDB) measurements on various Si samples and Brazilian quartz having low quartz structure are presented with the aim to give further strong indication of the existence of a low quartz structure, but not of Si divacancies as frequently considered, at the SiO2/Si interface.
Keywords: Slow-positron spectroscopy; Coincidence Doppler broadening; Silicon; Brazilian quartz; Silicon divacancy; SiO2/Si interface
  • Applied Surface Science 252(2006), 3368-3371


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Publ.-Id: 8318