Characterization of sputtered Shape Memory Alloy Ni-Ti films by cross-sectional TEM and SEM

Characterization of sputtered Shape Memory Alloy Ni-Ti films by cross-sectional TEM and SEM

Martins, R. M. S.; Mücklich, A.; Schell, N.; Silva, R. J. C.; Mahesh, K. K.; Braz Fernandes, F. M.

Characterization of sputtered Shape Memory Alloy Ni-Ti films by cross-sectional TEM and SEM

Keywords: shape memory alloy; Ni-Ti films TEM; SEM

  • Poster
    INCOMAM’07 - International Conference on Microscopy and Microanalysis - XLII Congress of the Portuguese Microscopy Society, 06.-07.12.2007, Coimbra, Portugal
  • Microscopy and Microanalysis 14(2008)supp 3, 85-86
    DOI: 10.1017/S1431927608089460

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Publ.-Id: 10756