In-situ X-ray experiments for material science
In-situ X-ray experiments for material science
Grenzer, J.
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 21358) publication
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Invited lecture (Conferences)
Workshop „Advanced X-ray Diffraction for Semiconductor Materials and Technology“, 03.-04.04.2014, Frankfurt/Oder, Germany
Permalink: https://www.hzdr.de/publications/Publ-21358
Publ.-Id: 21358
