GISAXS Investigation using a Standard Laboratory Diffractometer

GISAXS Investigation using a Standard Laboratory Diffractometer

Grenzer, J.; Kharchenko, A.; Gateshki, M.; Holz, T.

The development of new materials is today closely related to the "creation" of new functional nanostructures. Structural investigations are the key to establish a connection between the functional and structural properties that generate this function. This knowledge makes it possible to design new materials with precisely predetermined properties. The function of nanostructures is not only determined by their internal structure, but in large part by their morphology and surface properties.
Small angle X-ray scattering in grazing incidence (GISAXS) has the advantage over imaging microscopy (TEM), that usually no complex sample preparation is necessary and larger sample volumes can be analyzed. GISAXS allows the morphology of near-surface structures as well as their (inner) electron density distribution to be determined. GISAXS studies have long been almost exclusively performed at specialized synchrotron beamlines, as the requirements on e.g. on the beam quality were only hard to met with conventional laboratory equipment. The development of microfocus sources in the combination of high-performance optics and especially the new semiconductor area detectors established GISAXS investigations increasingly in the laboratory.

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Publ.-Id: 21362