X-ray studies of silicon wafers implanted with MeV Ge⁺⁺ions

X-ray studies of silicon wafers implanted with MeV Ge⁺⁺ions

Eichhorn, F.; Sass, J.; Mazur, K.

• Lecture (Conference)
  4th Europ. Conf. on High Resolution X-ray Diffraction and Topography, Durham/GB, Sept. 9 - 12, 1998

Permalink: https://www.hzdr.de/publications/Publ-2206
Publ.-Id: 2206