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Data to Impact on various cleaning procedures on p-GaN surfaces
Schaber, J.; Xiang, R.; Arnold, A.; Ryzhov, A.; Teichert, J.; Murcek, P.; Zwartek, P.; Ma, S.; Michel, P.
This folder "XPS data" contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.
Furthermore, the folder "REM Images" contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.
All images that are published in the main manuscript are collected as .tif files in the folder "images".
Keywords: damage effects; sputtering damage; surface cleaning; p-GaN; photocathode
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 36606) publication
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 36606) publication
- DOI: 10.1002/sia.7207 references this (Id 36606) publication
Reseach data in the HZDR data repository RODARE
Publication date: 2023-02-23 Open access