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Data to Impact on various cleaning procedures on p-GaN surfaces

Schaber, J.; Xiang, R.; Arnold, A.; Ryzhov, A.; Teichert, J.; Murcek, P.; Zwartek, P.; Ma, S.; Michel, P.

This folder "XPS data" contains original and evaluated XPS data (.vms) on a p-GaN sample which was treated at various temperatures and underwent Ar+ irradiation.

Furthermore, the folder "REM Images" contains REM images (.tif) and EDX data (.xlsx) on the used excessively treated sample.

All images that are published in the main manuscript are collected as .tif files in the folder "images".

Keywords: damage effects; sputtering damage; surface cleaning; p-GaN; photocathode

Related publications

DOI: 10.17815/jlsrf-2-58 is cited by this (Id 36606) publication
DOI: 10.17815/jlsrf-3-159 is cited by this (Id 36606) publication
DOI: 10.1002/sia.7207 references this (Id 36606) publication

Reseach data in the HZDR data repository RODARE
Publication date: 2023-02-23 Open access
DOI: 10.14278/rodare.2167
Versions: 10.14278/rodare.2168
License: CC-BY-4.0

Downloads

Veröffentlichung im HZDR-Daten-Repository RODARE - Id 2167

Permalink: https://www.hzdr.de/publications/Publ-36606
Publ.-Id: 36606