Publications Repository - Helmholtz-Zentrum Dresden-Rossendorf

Electrical characterization of SiO2 layers contaning Ge and Si nanoclusters

Gebel, T.

no abstract delivered from author

Keywords: nanocluster

  • Lecture (others)
    Naval Research Laboratory, Washington DC, USA, Nov. 17, 1999

Permalink: https://www.hzdr.de/publications/Publ-4873
Publ.-Id: 4873