Study of 60° misfit dislocations in semiconductor epi-layers

Sass, J.; Mazur, K.; Eichhorn, F.; Turos, A.; Gladki, A.; Jasik, A.

no abstract delivered from author

Keywords: epi-layer; dislocation; semiconductor; X-ray scattering

Lecture (Conference)
2nd Seminar of Bruker-axs and Bruker-Nonius September 22 - 24, 2002 Krynica Gorska (Poland)

Permalink: https://www.hzdr.de/publications/Publ-4988
Publ.-Id: 4988