Characterization of lateral surface nanostructures on GaAs by X-ray diffraction

Mazur, K.; Sass, J.; Kowalik, A.; Eichhorn, F.; Gladki, A.

no abstract delivered from author

Keywords: lateral surface structure; GaAs; X-ray diffraction

Lecture (Conference)
2nd Seminar of Bruker-axs and Bruker-Nonius September 22 - 24, 2002 Krynica Gorska (Poland)

Permalink: https://www.hzdr.de/publications/Publ-4989
Publ.-Id: 4989