Contact
Dr. Gregor Hlawacek
Head Ion Induced Nanostructures
Ion Microscopy
g.hlawacek
hzdr.de
Phone: +49 351 260 3409
+49 351 260 2411
Ion Induced Nanostructures
We study processes during the interaction of low energy (10 eV – 50 keV) ions with different charge states with materials, especially for the controlled modification and nano-patterning of their surfaces. Such modifications can be material removal through sputtering of surface atoms but also near surface ion beam mixing, ion beam induced defect engineering, or implantation of guest atoms (see figure below). Bottom up as well as top down surface structuring can be achieved through the use of either broad beam irradiation or focused ion beam irradiation.
The first one allows to roughen, smoothen, or clean technical surfaces. Furthermore, the energy deposited by the continuous ion impact drives the surface out of equilibrium inducing many processes on the surface and the sub-surface region.
Alternatively, focused ion beams allow the top down structuring of surfaces or surface near regions with a high spatial resolution compatible with modern nanostructure fabrication requirements. In our group we employ a wide range of focused ion beams from very light nobel gas ions to small heavy ion clusters to understand the behaviour of materials and create state-of-the-art nanostructures.
Main research topics:
Pattern formation and surface analytics
Focused Ion Beams
Helium Ion Microscopy
Setups - FWIZ-N
Group information:
Group Members - Ion Induced Nanostructures
Recent publications
Older publications can be found in the database (longer loading time)
2021
2020
Measurement of Ehrlich-Schwoebel barrier contribution to the self-organized formation of ordered surface patterns on Ge(001)
P. Myint, D. Erb, X. Zhang, L. Wiegart, Y. Zhang, A. Fluerasu, R. Headrick, S. Facsko, K. Ludwig
Downloads:
- Original PDF 1,6 MB Secondary publication
Superconducting properties of in-plane W-C nanowires grown by He+ Focused Ion Beam Induced Deposition
P. Orús, R. Córdoba, G. Hlawacek, J. M. de Teresa
Related publications
- HIM FIBID dataset for Superconducting properties of … (Id 31704) HZDR-primary research data are used by this (Id 31703) publication
Downloads:
- Fulltext from iopscience.iop.org
- Secondary publication expected from 10.11.2021
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
E. Serralta Hurtado De Menezes, N. Klingner, O. de Castro, M. Mousley, S. Eswara, S. Duarte Pinto, T. Wirtz, G. Hlawacek
Related publications
- Data for: Scanning transmission imaging in the helium ion … (Id 31631) HZDR-primary research data are used by this (Id 31506) publication
Nanopatterning of the (001) surface of crystalline Ge by ion irradiation at off-normal incidence: Experiment and simulation
D. Erb, R. de Schultz, A. Ilinov, K. Nordlund, M. R. Bradley, S. Facsko
Downloads:
- Original PDF 6,1 MB Secondary publication
General Colloidal Synthesis of Transition-Metal Disulfide Nanomaterials as Electrocatalysts for Hydrogen Evolution Reaction
C. Meerbach, B. Klemmed, D. Spittel, C. Bauer, Y. J. Park, R. Hübner, H. Y. Jeong, D. Erb, H. S. Shin, V. Lesnyak, A. Eychmüller
Sputtering of nanostructured tungsten and comparison to modelling with TRI3DYN
R. Stadlmayr, P. S. Szabo, D. Mayer, C. Cupak, T. Dittmar, L. Bischoff, S. Möller, M. Rasinski, R. A. Wilhelm, W. Möller, F. Aumayr
Downloads:
- Final Draft PDF 10,2 MB Secondary publication
An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
S. H. Andany, G. Hlawacek, S. Hummel, C. Brillard, M. Kangül, G. E. Fantner
Related publications
- HIM and AFM Data set from first AFM in the HIM test (Id 30718) HZDR-primary research data are used by this (Id 30689) publication
Boron Liquid Metal Alloy Ion Sources for Special FIB Applications
L. Bischoff, N. Klingner, P. Mazarov, W. Pilz, F. Meyer
Downloads:
- Final Draft PDF 435 kB Secondary publication
Visualisation and Chemical Characterisation of the Cathode Electrolyte Interphase in High Voltage Li-ion Battery Material LiCoPO4 using He-ion Microscopy and in-situ Time-of-Flight Secondary Ion Mass Spectroscopy
L. Wheatcroft, N. Klingner, R. Heller, G. Hlawacek, D. Ozkaya, J. Cookson, B. J. Inkson
Contact
Dr. Gregor Hlawacek
Head Ion Induced Nanostructures
Ion Microscopy
g.hlawacekhzdr.de
Phone: +49 351 260 3409
+49 351 260 2411
