Contact
Dr. Gregor Hlawacek
Head Ion Induced Nanostructures
Ion Microscopy
g.hlawacek
hzdr.de
Phone: +49 351 260 3409
+49 351 260 2411
Ion Induced Nanostructures
We study processes during the interaction of low energy (10 eV – 50 keV) ions with different charge states with materials, especially for the controlled modification and nano-patterning of their surfaces. Such modifications can be material removal through sputtering of surface atoms but also near surface ion beam mixing, ion beam induced defect engineering, or implantation of guest atoms (see figure below). Bottom up as well as top down surface structuring can be achieved through the use of either broad beam irradiation or focused ion beam irradiation.
The first one allows to roughen, smoothen, or clean technical surfaces. Furthermore, the energy deposited by the continuous ion impact drives the surface out of equilibrium inducing many processes on the surface and the sub-surface region.
Alternatively, focused ion beams allow the top down structuring of surfaces or surface near regions with a high spatial resolution compatible with modern nanostructure fabrication requirements. In our group we employ a wide range of focused ion beams from very light nobel gas ions to small heavy ion clusters to understand the behaviour of materials and create state-of-the-art nanostructures.
Main research topics:
Pattern formation and surface analytics
Focused Ion Beams
Helium Ion Microscopy
Setups - FWIZ-N
Group information:
Group Members - Ion Induced Nanostructures
Recent publications
Older publications can be found in the database (longer loading time)
2020
General Colloidal Synthesis of Transition-Metal Disulfide Nanomaterials as Electrocatalysts for Hydrogen Evolution Reaction
C. Meerbach, B. Klemmed, D. Spittel, C. Bauer, Y. J. Park, R. Hübner, H. Y. Jeong, D. Erb, H. S. Shin, V. Lesnyak, A. Eychmüller
An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
S. H. Andany, G. Hlawacek, S. Hummel, C. Brillard, M. Kangül, G. E. Fantner
Related publications
- HIM and AFM Data set from first AFM in the HIM test (Id 30718) HZDR-primary research data are used by this (Id 30689) publication
Boron Liquid Metal Alloy Ion Sources for Special FIB Applications
L. Bischoff, N. Klingner, P. Mazarov, W. Pilz, F. Meyer
Downloads:
- Final Draft PDF 435 kB Secondary publication
2019
Lithium Ion Beams from Liquid Metal Alloy Ion Sources
W. Pilz, P. Mazarov, N. Klingner, S. Bauerdick, L. Bischoff
Downloads:
- Final Draft PDF 497 kB Secondary publication
Time-of-flight secondary ion mass spectrometry in the helium ion microscope
N. Klingner, R. Heller, G. Hlawacek, S. Facsko, J. von Borany
Downloads:
- Final Draft PDF 6,8 MB Secondary publication
Contact
Dr. Gregor Hlawacek
Head Ion Induced Nanostructures
Ion Microscopy
g.hlawacekhzdr.de
Phone: +49 351 260 3409
+49 351 260 2411
