2nd international HeFIB conference


Helium and emerging Focused Ion Beams

June 11 - 13, 2018 in Dresden, Germany

The purpose of the conference is to bring together the rapidly growing community active in the fields of Helium Ion Microscopy and other emerging Focused Ion Beam technologies in view of stimulating scientific and technical exchanges.

Program and Main Topics

The conference focuses on the following non exhaustive list:

  • Helium Ion Microscopy
  • Emerging Focused Ion Beam technologies and novel ion sources
  • Materials nano-modification and lithography with ions
  • Nano-imaging and nanoanalytics, including correlative approaches
  • Bio-imaging
  • Fundamentals and modelling of particle-matter interactions
  • Instrument development

HeFIB 2018 conference photo ©Copyright: Dr. Hlawacek, Gregor, HeFIB Konferenzfoto

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