Contact

Dr. Kay Potzger

Project-group head, works council
Magnetism
k.potzgerAthzdr.de
Phone: +49 351 260 3244

Dr. Kilian Lenz

Research Group Head
Magnetism
k.lenzAthzdr.de
Phone: +49 351 260 2435
Fax: +49 351 260 12435

Dr. Helmut Schultheiß

Group Leader
Spin: Interaction and Control
Spin interaction and control
h.schultheissAthzdr.de
Phone: +49 351 260 3243

Experimentelle Ausrüstung

Schichtabschneidung

Magnetormetrie

Magnetometry

 1. Ferromagnetic Resonance - FMR
 2. Low temperature Ferromagnetic Resonance
 3. Microreosnator Ferromagnetic Resonance
 4. Brillouin Light Scattering Microscope (BLS)
 5. Time-Resolved Magneto-Optical Kerr Effect
 6. Magneto-Optical Kerr Effect - MOKE
 7. Kerr Microscopy
 8. Probe Station for Nanostructures
 9. Frequency-resolved MOKE for optically detected FMR
10. Atomic & Magnetic for Microscope
11. Atomic & Magnetic for Microscope
12. Electric Prober for Phase Change Materials
13. Vibrating sample magnetometer - VSM


Bild Beschreibung
FMR

1. Ferromagnetic Resonance - FMR

  • in-house development
  • Agilent E8364B Vector Network Analyzer:
    Frequency range 0.05 - 50 GHz
  • Bruker Electromagnet: max. 2.2 T
  • polar and azimuthal sample rotation
  • Helmholtz magnet: max 0.1 T

Responsible: K. Lenz

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Cryo-FMR

2. Temperature variable Ferromagnetic Resonance

  • Attocube Attodry 1000 closed cycle cryostat
    • 5 T split-coil magnet
    • temperature range 4 - 300 K
  • Agilent N5225A Vector Network Analyzer:
    Frequency range 0.05 - 50 GHz
  • full polar and azimuthal sample rotation
  • SMU for resistancd and magnetoresistance measurements

Responsible: K. Lenz

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Microresonator-FMR

3. Microresonator Ferromagnetic Resonance

  • in-house development
  • microwave bridge
    Frequency range 4-40 GHz
  • Bruker Electromagnet: max. 2.2 T
  • azimuthal sample rotation
  • field modulation/Lock-in detection

Responsible: K. Lenz

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Foto: Mikrofocus BLS Setup ©Copyright: Dr. Katrin Schultheiß

4. Brillouin-Lichtstreumikroskop 1+2

  • in-house development
  • BLS1: Phase- and time resolved
    BLS2: time resolved only
  • Tandem Fabry-Perot interferometer TFP-2 HC by JRS Scientific Instruments
  • Sample positioning by XM Ultra-Precision Linear Motor Stages von Newport
  • 50x and 100x objectives
  • Magnet field up to 0.9 T
  • Time resolution: down to 30ps using TimeTagger 20 from Swabian Instruments
  • GSG Picoprobes for microwave input
  • RF excitation up to 40 GHz, 30 dBm max.
  • DC excitation by SMU
  • arbitrary and pulse pattern generator

Responsible: H. Schultheiss

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TR-MOKE Setup

5. Time-Resolved Magneto-Optical Kerr Effect

  • in-house development
  • Delay time up to 5 ns
  • Feld: max. 1 T
  • Femtolasers XL500
  • Wavelength: 800 nm
  • Pulse-Length 40 fs
  • Repetition rate: 5 MHz
  • Output Power: 2.6 W
  • Energy: 500 nJ/pulse

Responsible: H. Schultheiß

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Instrumentation MOKE

6. Magneto-Optical Kerr Effect - MOKE

  • in-house development
  • longitudinal and transversal Kerr effect
  • Field (in-plane): max. 400 Oe (Helmholtz coils)
  • x, y, f scanning capabilities
  • Temperature range: RT – 600 K

Responsible: H. Schultheiß

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Kerr-Mikroskop

7. Kerr-Microscopy

  • Manufacturer: Evico-Magnetics
  • Microscope: Zeiss Axio Imager.D1m
  • Light Source: two high-power LEDs (blue+red)
  • Bipolar and quadrupol magnet
  • twin-color system for quantitative Kerr analysis
  • integrated AMR measurement

Responsible: H. Schultheiß

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PM5

8. Probe Station for Nanostructures

  • Süss MicroTech PM5 Wafer Prober
  • Süss Z-Probes: GSG 0-50 GHz, 150µm Pitch
  • Evico Magnetics electromagnet: Bmax= 0.6 T
  • Optem CCD-Microscope
  • Agilent MXA spectrum analyzer
  • Picosecond PulseLab pulser
  • Tektronix DPO72004 20GHz real-time oscilloscope
  • Keithley source meter

Responsible: K. Lenz

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FR-MOKE Setup für optisch detektierte FMR

9. Frequency-resolved MOKE

  • optically detected FMR (5 µm spatial resolution)
  • Magnetic field up to 1.4 T
  • Kepco power supply
  • Frequency range up to 35 GHz

Responsible: K. Lenz

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AMF/MFM 

10.  Atomic and Magnetic Force Microscope (AFM/MFM)

  • Veeco/DI Multimode
  • sample size: 10 x 10 mm²
  • scan area max. 100x100 µm²
  • scan area 15x15 µm²
  • magnetic field 0 - 40 mT
  • resolution:
    • AFM ~10 nm
    • MFM ~30 nm
  • Scanning Spreading Resistance Microscopy (SSRM) option

 Responsible: K. Potzger

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Foto: Bruker Icon Dimension AFM ©Copyright: Dr. Sven Stienen

11. Atomic Force Microscope (AFM/MFM)

  • Bruker Icon Dimension
  • sample size: up to 20 x 20 cm²
  • scan area max. 100 x 100 µm²
  • AFM: ScanAsyst mode, tapping mode, contact mode
  • MFM: lifted mode
  • resolution: ~1nm

Responsible: K. Potzger

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12. Electric prober for phase change materials

  • temperature and magnetic field dependence of resistance
  • sample size: 10 x 10 mm²
  • temperature RT - 450 K
  • field: 1 kOe in-plane
  • base pressure < 1e-6 mbar

Responsible: K. Potzger

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Foto: Vibrationsmagnetometer ©Copyright: Dr. Kay Potzger

13. Vibrating Sample Magnetometer - VSM

  • magnetic field max. ±1.8 T
  • sensitivity: 5x10-6 emu (0.8x10-6 rms noise)
  • angular range 360°
  • vector coil option
  • room temperature

responsible: R. Salikhov