High-Speed-PIXE is the term for fast spatial-resolved particle-induced X-ray emission.
Actually, a unique HS-PIXE-Set-up is developed at the HZDR ion beam centre by using high-energy protons from a 6 MV tandem accelerator as excitation radiation for spatial-resolved chemical analysis.
The spatial resolution is hereby not reached by scanning the sample, but by a CCD-Based X-ray camera(1) with spatial and energy resolution (pixel: 48 x 48 µm2). A similar set-up has yet been tested only at synchrotron facilities (Scharf et al., 2011). The use of such kind of a camera with protons as excitation source is unique on a world-wide scale.
You can download a (German) poster with first HS-PIXE results here(2).
HS-PIXE paper about improvement of lateral resolution and avoiding optical artefacts is out (May 2018)
J. Buchriegler, N. Klingner, D. Hanf, F. Munnik, S.H. Nowak, O. Scharf, R. Ziegenrücker, A.D. Renno, J. von Borany, Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts, X-Ray Spectrometry (2018)(3).
HS-PIXE paper is out (June 2016)
D. Hanf, J. Buchriegler, A.D. Renno, S. Merchel, F. Munnik, R. Ziegenrücker, O. Scharf, S.H. Nowak, J. von Borany, A new Particle-Induced X-ray Emission set-up for laterally resolved analysis over wide areas, Nucl. Instr. and Meth. in Phys. Res. B. 377 (2016) 17-24.(4)
|HS-PIXE beamline (Dec 2012)|
|First HS-PIXE "element picture" (18th Dec 2012)
(for the curious one of you: it is a silver ore from Kongsberg(5), Norway!)
|HS-PIXE sample chamber (Oct 2012)|
O. Scharf, S. Ihle, I. Ordavo, V. Arkadiev, A. Bjeoumikhov, S. Bjeoumikova, G. Buzanich, R. Gubzhokov, A. Günther, R. Hartmann, M. Kühbacher, M. Lang, N. Langhoff, A. Liebel, M. Radtke, U. Reinholz, H. Riesemeier, H. Soltau, L. Strüder, A. F. Thünemann, R. Wedell, Compact pnCCD-Based X-ray Camera with High Spatial and Energy Resolution: A Color X-ray Camera, Analyt. Chem. 83 (2011) 2532–2538.
Content from Sidebar
Dr. Axel Renno(7)
Group Leader Ion Beam Analysis
Phone: +49 351 260 - 3274
URL of this article