Conclusions and References
Conclusions
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Strong blue-violet PL from Si-, Ge- and Sn-implanted SiO2 layers.
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Strong EL from Ge-implanted SiO2 layers with a power efficiency
up to 5x10-4.
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The blue-violet PL is caused by a T1->S1 transition of a molecular luminescence
center.
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The differences of between Si, Ge and Sn can be well explained by the Heavy-atom-effect.
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The EL and PL are caused by one and the same luminescence center.
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The EL spectrum is independent on injection current.
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The EL intensity increases linearly with the injection current.
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The electrons will be injected via Fowler Nordheim tunneling.
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Ge-implanted SiO2 layers held great promise for optoelectronic applications.
References
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L. Rebohle, J. von Borany, R.A: Yankov, W. Skorupa, I.E. Tyschenko, H.
Fröb, K. Leo, Appl. Phys. Lett. 71:19 (1997) 107
-
L. Rebohle, J. von Borany, R. Grötzschel, A. Markwitz, B. Schmidt,
I.E. Tyschenko, W. Skorupa, H. Fröb, K. Leo, phys. stat. sol. (a)
165 (1998) 31
-
A. Markwitz, L. Rebohle, H. Hofmeister, W. Skorupa, Nucl. Instr. Meth.
Phys. Res. B 147 (1999) 361
-
A. Markwitz, R. Grötzschel, K.H. Heinig, L. Rebohle, W. Skorupa, Nucl.
Instr. Meth. Phys. Res. B 152 (1999) 319
-
L. Rebohle, J. von Borany, W. Skorupa, I.E. Tyschenko, H. Fröb, J.
Luminesc. 80 (1999) 275
-
L. Rebohle, I.E. Tyschenko, J. von Borany, W. Skorupa, H. Fröb, SPIE
Vol. 3630 (1999) 155
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