Contact

Dr. Jürgen Lindner

Head
Magnetism
j.lindnerhzdr.de
Phone: +49 351 260 3221

Bachelor und Masterarbeiten

FWIN Kalender

Lehre

Sicherheitsunterweisung

Experimental Setup and Equipment

Thin Film Deposition
Magnetometry

In case of interest to use the equipment for experiments, please contact the responsible person mentioned below

Thin Film Deposition

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	AJA sputter chamber 5 confocal sputter guns 1 face-to-face sputter gun 2 rf sources possible max. substrate size 3" with substrate rotation high vacuum Responsible: T. Naumann
	Bestec sputter chamber 8 sputter guns, face-to-face&confocal 2 RF sources Ion source max. sample size 4" (100 mm) substrate rotation up to 36 rpm temperature range: RT - 1200 K ultrahigh vacuum Responsible: T. Naumann
	ALDI: apparatus for layer deposition and interfaces Manufacturer: Createc MBE: 5 pocket e-beam evaporator 4 Knudsen cells EFM3 evaporator Ion source: Model Kremer IQ100 Plasma source LEED AES sample size 10 x 10 mm² Responsible: K. Potzger
	Sputnik: sputter chamber sample size 10 x 10 mm² temperature range: RT - 1000 °C 2 targets base pressure 1e-10 mbar sputter pressure 3e-3 mbar at 43 sccm Argon Responsible: K. Potzger

Magnetometry

1. Ferromagnetic Resonance - FMR
2. Low temperature Ferromagnetic Resonance
3. Microreosnator Ferromagnetic Resonance
4. Brillouin Light Scattering Microscope (BLS)
5. Magneto-Optical Kerr Effect - MOKE
6. Kerr Microscopy
7. Probe Station for Nanostructures
8. Frequency-resolved MOKE for optically detected FMR
9. Atomic & Magnetic for Microscope
10. Atomic & Magnetic for Microscope
11. Electric Prober for Phase Change Materials
12. Vibrating sample magnetometer - VSM

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	1. Ferromagnetic Resonance - FMR in-house development Agilent E8364B Vector Network Analyzer: Frequency range 0.05 - 50 GHz Bruker Electromagnet: max. 2.2 T polar and azimuthal sample rotation Helmholtz magnet: max 0.1 T Responsible: K. Lenz top of page
	2. Temperature variable Ferromagnetic Resonance Attocube Attodry 1000 closed cycle cryostat 5 T split-coil magnet temperature range 4 - 300 K Agilent N5225A Vector Network Analyzer: Frequency range 0.05 - 50 GHz full polar and azimuthal sample rotation SMU for resistancd and magnetoresistance measurements Responsible: K. Lenz top of page
	3. Microresonator Ferromagnetic Resonance in-house development microwave bridge Frequency range 4-40 GHz Bruker Electromagnet: max. 2.2 T azimuthal sample rotation field modulation/Lock-in detection Responsible: K. Lenz top of page
	4. Brillouin-Lichtstreumikroskop 1+2 in-house development BLS1: Phase- and time resolved BLS2: time resolved only Tandem Fabry-Perot interferometer TFP-2 HC by JRS Scientific Instruments Sample positioning by XM Ultra-Precision Linear Motor Stages von Newport 50x and 100x objectives Magnet field up to 0.9 T Time resolution: down to 30ps using TimeTagger 20 from Swabian Instruments GSG Picoprobes for microwave input RF excitation up to 40 GHz, 30 dBm max. DC excitation by SMU arbitrary and pulse pattern generator Responsible: H. Schultheiss top of page/a>
	5. Magneto-Optical Kerr Effect - MOKE in-house development longitudinal and transversal Kerr effect Field (in-plane): max. 400 Oe (Helmholtz coils) x, y, f scanning capabilities Temperature range: RT – 600 K Responsible: H. Schultheiß top of page
	6. Kerr-Microscopy Manufacturer: Evico-Magnetics Microscope: Zeiss Axio Imager.D1m Light Source: two high-power LEDs (blue+red) Bipolar and quadrupol magnet twin-color system for quantitative Kerr analysis integrated AMR measurement Responsible: H. Schultheiß top of page
	7. Probe Station for Nanostructures Süss MicroTech PM5 Wafer Prober Süss Z-Probes: GSG 0-50 GHz, 150µm Pitch Evico Magnetics electromagnet: B_max= 0.6 T Optem CCD-Microscope Agilent MXA spectrum analyzer Picosecond PulseLab pulser Tektronix DPO72004 20GHz real-time oscilloscope Keithley source meter Responsible: K. Lenz top of page
	8. Frequency-resolved MOKE optically detected FMR (5 µm spatial resolution) Magnetic field up to 1.4 T Kepco power supply Frequency range up to 35 GHz Responsible: K. Lenz top of page
	9. Atomic and Magnetic Force Microscope (AFM/MFM) Veeco/DI Multimode sample size: 10 x 10 mm² scan area max. 100x100 µm² scan area 15x15 µm² magnetic field 0 - 40 mT resolution: AFM ~10 nm MFM ~30 nm Scanning Spreading Resistance Microscopy (SSRM) option Responsible: K. Potzger top of page
	10. Atomic Force Microscope (AFM/MFM) Bruker Icon Dimension sample size: up to 20 x 20 cm² scan area max. 100 x 100 µm² AFM: ScanAsyst mode, tapping mode, contact mode MFM: lifted mode resolution: ~1nm Responsible: K. Potzger top of page
	11. Electric prober for phase change materials temperature and magnetic field dependence of resistance sample size: 10 x 10 mm² temperature RT - 450 K field: 1 kOe in-plane base pressure < 1e-6 mbar Responsible: K. Potzger top of page
	12. Vibrating Sample Magnetometer - VSM magnetic field max. ±1.8 T sensitivity: 5x10^-6 emu (0.8x10^-6 rms noise) angular range 360° vector coil option room temperature responsible: R. Salikhov