Bild Beschreibung
Bild: REM Zeiss EVO 50
REM Zeiss EVO 50

SEM Zeiss EVO 50

  • Tungsten Cathode
  • Acceleration Voltage 0.2 - 30 kV
  • Resolution: 3 nm at 30 kV
  • Detectors:
    • Everhart-Thornley Secondary Electron Detector
    • 4 Quadrant Backscatter Electron Detector
  • Chamber: diameter: 365 mm; High: 255 mm
  • 5-Axes Motorised Compucentric Specimen Stage


  • Light element detector X-Flash 4010
  • Energy resolution 127 eV

Cressington DUAL Coating System 108a/c

  • Cressington 108auto Sputter Coater
  • to sputter thin layer of gold
  • Cressington 108carbon/A Carbon Coater
  • to evaporate an electrical conductive carbon layer

Application fields

  • Fractography of unirradiated and irradiated specimens of reactor pressure vessel steels and other materials
  • Characterization of surface structures of different materials
  • Visualization and element analysis of insulation debris and corrosion products for investigation of chemical effects during LOCA incidents in NPP
  • Investigation of bacteria and biofilms
  • EBSD on SEM Zeiss NVision 40 with Bruker e-FlashHR- detector and QUANTAX CrystAlign EBSD-system