Depth-sensing nanoindentation in combination with atomic force microscopy (AFM)

While neutrons penetrate deeply into matter, energetic ions give rise to damage only in a µm-thin layer next to the surface. Nanoindentation is a suitable tool to probe the mechanical behaviour of thin layers. It provides a link between irradiation-induced nanofeatures (dislocation loops, voids, precipitates) and mechanical property changes. Our nano testing lab is equipped with a nanomechanics test device for depth-sensing nanoindentation and an atomic force microscope (AFM). The AFM can be run either in combination with the nanomechanics tester for the purpose of indentation imaging or as a stand-alone device.

Universal nanomechanics tester – UNAT (ASMEC)

• Digital force resolution <100 nN
• Digital displacement resolution <50 pm
• Noise of force measurement <10 µN
• Noise of displacement measurement <1 nm
• x-y-z positioning device:
• Travelling range 200 mm x 50 mm x 50 mm
• Step size 0,5 µm x 0,1 µm x 0,1 µm
• Tandem microscope (optical)
• Berkovich indenter
• Active vibration suppression

Atomic force microscope Nanite B (Nanosurf)

• x-y-z scanning range 110 µm x 110 µm x 20 µm
• Contact mode and dynamic mode