Dr. Stefan Facsko
Head Ion Induced Nanostructures
Phone: +49 351 260 - 2987
Fax: 12987, 2879

Publikationen - Selbstorganisierte Musterbildung



  • D. Gkogkou, B. Schreiber, T. Shaykhutdinov, H.K. Ly, U. Kuhlmann, U. Gernert, S. Facsko, P. Hildebrandt, N. Esser, K. Hinrichs, I.M. Weidinger, and T.W.H. Oates, Polarization- and Wavelength-Dependent Surface-Enhanced Raman Spectroscopy Using Optically Anisotropic Rippled Substrates for Sensing, ACS Sens. 1, 318 (2016), doi:10.1021/acssensors.5b00176.
  • E. Iacob, R. Dell'Anna, D. Giubertoni, E. Demenev, M. Secchi, R. Boettger, and G. Pepponi, Nanofabrication of self-organized periodic ripples by ion beam sputtering, Microelectronic Engineering 155, 50 (2016), doi:10.1016/j.mee.2016.02.025


  • M. Buljan, S. Facsko, I.D. Marion, V.M. Trontl, M. Kralj, M. Jerčinović, C. Baehtz, A. Muecklich, V. Holy, N. Radic, and J. Grenzer, Self-assembly of Ge quantum dots on periodically corrugated Si surfaces, Appl. Phys. Lett. 107, 203101 (2015)..
  • X. Ou, K.-H. Heinig, R. Hübner, J. Grenzer, X. Wang, M. Helm, J. Fassbender, and S. Facsko, Faceted nanostructure arrays with extreme regularity by self-assembly of vacancies, Nanoscale 7, 18928 (2015), doi:10.1039/C5NR04297F.


  • B. Teshome, S. Facsko, A. Keller, Topography-controlled alignment of DNA origami nanotubes on nanopatterned surfaces, Nanoscale (2014) [doi:10.1039/c3nr04627c].
  • M. Krause, M. Buljan, A. Mucklich, W. Möller, M. Fritzsche, S. Facsko, R. Heller, M. Zschornak, S. Wintz, et al., Compositionally modulated ripples during composite film growth: Three-dimensional pattern formation at the nanoscale, Phys. Rev. B 89 085418 (2014) [doi:10.1103/PhysRevB.89.085418].
  • M. Engler, F. Frost, S. Müller, S. Macko, M. Will, R. Feder, D. Spemann, R. Hübner, S. Facsko, et al., Silicide induced ion beam patterning of Si(001)Nanotechnology25(11), 115303 (2014), doi:10.1088/0957-4484/25/11/115303.
  • D. K. Ball, K. Lenz, M. Fritzsche, G. Varvaro, S. Günther, P. Krone, D. Makarov, A. Mucklich, S. Facsko, et al., “Magnetic properties of granular CoCrPt:SiO 2thin films deposited on GaSb nanocones,” Nanotechnology 25(8), 085703, (2014) [doi:10.1088/0957-4484/25/8/085703].


  • M. Korner, K. Lenz, R. A. Gallardo, M. Fritzsche, A. Mucklich, S. Facsko, J. Lindner, P. Landeros, and J. Fassbender, Two-magnon scattering in permalloy thin films due to rippled substrates, Phys. Rev. B 88, 054405 (2013) [doi:10.1103/PhysRevB.88.054405].

  • X. Ou, A. Keller, M. Helm, J. Fassbender, and S. Facsko, Reverse Epitaxy of Ge: Ordered and Faceted Surface PatternsPhys. Rev. Lett. 111, 016101 (2013) [doi:10.1103/PhysRevLett.111.016101].

  • B. Khanbabaee, A. Biermanns, S. Facsko, J. Grenzer, and U. Pietsch, Depth profiling of Fe-implanted Si(100) by means of X-ray reflectivity and extremely asymmetric X-ray diffraction, Journal of Applied Crystallography 46, 505 (2013) [doi:10.1107/S0021889813004597].

  • M. O. Liedke, M. Korner, K. Lenz, M. Fritzsche, M. Ranjan, A. Keller, E. Čižmár, S. A. Zvyagin, S. Facsko, et al., Crossover in the surface anisotropy contributions of ferromagnetic films on rippled Si surfaces, Phys. Rev. B 87, 024424 (2013) [doi:10.1103/PhysRevB.87.024424].

  • R. Boettger, A. Keller, L. Bischoff, and S. Facsko, Mapping the local elastic properties of nanostructured germanium surfaces: from nanoporous sponges to self-organized nanodots, Nanotechnology 24, 115702 (2013) [doi:10.1088/0957-4484/24/11/115702].


  • M. Ranjan and S. Facsko, Anisotropic surface enhanced Raman scattering in nanoparticle and nanowire arraysNanotechnology23, 485307 (2012) [doi:10.1088/0957-4484/23/48/485307].
  • R. Böttger, L. Bischoff, S. Facsko, and B. Schmidt, Quantitative analysis of the order of Bi ion induced dot patterns on GeEPL98, 16009 (2012) [doi:10.1209/0295-5075/98/16009].
  • L. Persechini, M. Ranjan, F. Grossmann, S. Facsko, and J. F. McGilp, The linear and nonlinear optical response of native-oxide covered rippled Si templates with nanoscale periodicityPhys. Status Solidi B249, 1173 (2012) [doi:10.1002/pssb.201100553].
  • L. Bischoff, K. H. Heinig, B. Schmidt, S. Facsko, and W. Pilz, Self-organization of Ge nanopattern under erosion with heavy Bi monomer and cluster ionsNucl. Instr. Meth. B272, 198 (2012) [doi:10.1016/j.nimb.2011.01.064].
  • M. Ranjan, S. Facsko, M. Fritzsche, and Muke, Plasmon resonance tuning in Ag nanoparticles arrays grown on ripple patterned templatesMicroelectronic Engineering102, 44 (2012) [doi:10.1016/j.mee.2012.02.018].
  • M. Fritzsche, A. Muecklich, and S. Facsko, Nanohole pattern formation on germanium induced by focused ion beam and broad beam Ga+ irradiationAppl. Phys. Lett.100, 223108 (2012) [doi:10.1063/1.4721662].
  • M. O. Liedke, M. Korner, K. Lenz, F. Grossmann, S. Facsko, and J. Fassbender, Magnetic anisotropy engineering: Single-crystalline Fe films on ion eroded ripple surfacesAppl. Phys. Lett.100, 242405 (2012) [doi:10.1063/1.4729151].


  • A. Keller, M. Nicoli, S. Facsko, and R. Cuerno, Dynamic effects induced by renormalization in anisotropic pattern forming systemsPhys. Rev. E84, 015202 (2011) [doi:10.1103/PhysRevE.84.015202].
  • A. Keller, L. Peverini, J. Grenzer, G. J. Kovacs, A. Mucklich, and S. Facsko, Polycrystalline Ni thin films on nanopatterned Si substrates: From highly conformal to nonconformal anisotropic growth, Phys. Rev. B84, 035423 (2011) [doi:10.1103/PhysRevB.84.035423].
  • S. Numazawa, M. Ranjan, K. H. Heinig, S. Facsko, and R. Smith, Ordered Ag nanocluster structures by vapor deposition on pre-patterned SiO2J. Phys.: Condens. Matter23, 222203 (2011) [doi:10.1088/0953-8984/23/22/222203].
  • J. Zhou, S. Facsko, M. Lu, and W. Möller, Nanopatterning of Si surfaces by normal incident ion erosion: Influence of iron incorporation on surface morphology evolutionJ. Appl. Phys.109, 104315 (2011) [doi:10.1063/1.3585796].
  • A. Keller, M. Fritzsche, R. Ogaki, I. Bald, S. Facsko, M. D. Dong, P. Kingshott, and F. Besenbacher, Tuning the hydrophobicity of mica surfaces by hyperthermal Ar ion irradiationJ Chem Phys134, 104705 (2011) [doi:10.1063/1.3561292].
  • T. W. H. Oates, M. Ranjan, S. Facsko, and H. Arwin, Highly anisotropic effective dielectric functions of silver nanoparticle arraysOpt. Express19, 2014 (2011) [doi:10.1364/oe.19.002014].


  • A. Keller and S. Facsko, Tuning the quality of nanoscale ripple patterns by sequential ion-beam sputteringPhys. Rev. B82, 155444 (2010) [doi:10.1103/Physrevb.82.155444].
  • M. Ranjan, T. W. H. Oates, S. Facsko, and W. Möller, Optical properties of silver nanowire arrays with 35 nm periodicityOptics Letters35, 2576 (2010).
  • A. Kanjilal, S. Prucnal, M. Minniti, W. Skorupa, M. Helm, and S. Facsko, Crystalline ripples at the surface of ion eroded strained Si0.8Ge0.2 epilayersJ. Appl. Phys.107, 073513 (2010) [doi:10.1063/1.3369391].
  • A. Hanisch, A. Biermanns, J. Grenzer, S. Facsko, and U. Pietsch, Xe ion beam induced rippled structures on differently oriented single-crystalline Si surfacesJ. Phys. D: Appl. Phys.43, 112001 (2010) [doi:10.1088/0022-3727/43/11/112001].
  • A. Keller and S. Facsko, Ion-induced nanoscale ripple patterns on Si surfaces: theory and experimentMaterials3, 4811, (2010) [doi:10.3390/ma3104811].


  • J. Fassbender, T. Strache, M. O. Liedke, D. Marko, S. Wintz, K. Lenz, A. Keller, S. Facsko, I. Monch, et al., Introducing artificial length scales to tailor magnetic propertiesNew Journal of Physics11, 125002 (2009) [doi:10.1088/1367-2630/11/12/125002].
  • A. Keller, S. Facsko, and A. Möller, The morphology of amorphous SiO2 surfaces during low energy ion sputteringJ. Phys.: Condens. Matter21, 495305 (2009) [doi:10.1088/0953-8984/21/49/495305].
  • A. Keller, A. Biermanns, G. Carbone, J. Grenzer, S. Facsko, O. Plantevin, R. Gago, and T. H. Metzger, Transition from smoothing to roughening of ion-eroded GaSb surfacesAppl. Phys. Lett.94, 193103 (2009) [doi:10.1063/1.3136765].
  • A. Keller, R. Cuerno, S. Facsko, and W. Möller, Anisotropic scaling of ripple morphologies on high-fluence sputtered siliconPhys. Rev. B79, 115437 (2009) [doi:10.1103/Physrevb.79.115437].
  • A. Keller, S. Facsko, and W. Möller, Evolution of ion-induced ripple patterns on SiO2 surfacesNucl. Instr. Meth. B267, 656 (2009) [doi:10.1016/j.nimb.2008.11.044].
  • M. Körner, K. Lenz, M. O. Liedke, T. Strache, A. Mücklich, A. Keller, S. Facsko, and J. Fassbender, Interlayer exchange coupling of Fe/Cr/Fe thin films on rippled substratesPhys. Rev. B80, 214401 (2009) [doi:10.1103/PhysRevB.80.214401].


  • T. W. H. Oates, A. Keller, S. Noda, and S. Facsko, Self-organized metallic nanoparticle and nanowire arrays from ion-sputtered silicon templatesAppl. Phys. Lett.93, 063106 (2008) [doi:10.1063/1.2959080].
  • A. Biermanns, U. Pietsch, J. Grenzer, A. Hanisch, S. Facsko, G. Carbone, and T. H. Metzger, X-ray scattering and diffraction from ion beam induced ripples in crystalline siliconJ. Appl. Phys.104, 044312 (2008) [doi:10.1063/1.2973037].
  • A. Keller, S. Facsko, and W. Möller, Minimization of topological defects in ion-induced ripple patterns on siliconNew Journal of Physics10, 063004 (2008) [doi:10.1088/1367-2630/10/6/063004].
  • A. Keller, S. Rossbach, S. Facsko, and W. Möller, Simultaneous formation of two ripple modes on ion sputtered siliconNanotechnology19, 135303 (2008) [doi:10.1088/0957-4484/19/13/135303].
  • T. K. Chini, D. P. Datta, S. Facsko, and A. Mucklich, Room temperature photoluminescence from the amorphous Si structure generated under keV Ar-ion-induced surface rippling conditionAppl. Phys. Lett.92, 101919 (2008) [doi:10.1063/1.2896644].
  • D. Carbone, A. Alija, O. Plantevin, R. Gago, S. Facsko, and T. H. Metzger, Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringNanotechnology19, 035304 (2008) [doi:10.1088/0957-4484/19/03/035304].


  • M. O. Liedke, B. Liedke, A. Keller, B. Hillebrands, A. Mücklich, S. Facsko, and J. Fassbender, Induced anisotropies in exchange-coupled systems on rippled substratesPhys. Rev. B75, 220407 (2007) [doi:10.1103/Physrevb.75.220407].
  • T. W. H. Oates, A. Keller, S. Facsko, and A. Mücklich, Aligned silver nanoparticles on rippled silicon templates exhibiting anisotropic plasmon absorptionPlasmonics2, 47 (2007) [doi:10.1007/s11468-007-9025-z].