Contact

Dr. René Hübner
Electron Microscopy Laboratory
IBA/OSA
r.huebnerAthzdr.de
Phone: +49 351 260 3174
Fax: +49 351 260 13174

Titan 80-300 (FEI)

Titan 80-300

Electron source

  • Type: S-FEG
  • Accelerating voltages: 80 kV, 300 kV
  • Brightness: ~108 A cm-2 sr-1

Illumination

  • 3-condenser lens system

Imaging

  • Objective: S-Twin lens with imaging corrector (CEOS)
  • TEM information limit: 0.10 nm
  • STEM-HAADF resolution: 0.136 nm

Cameras and detectors

  • 4-megapixel CCD camera (Gatan, UltraScan 1000) for TEM
  • High-angle annular dark-field (HAADF) detector for STEM

Energy-Dispersive X-ray Spectroscopy (EDXS)

  • Retractable X-ray fluorescence detector (EDAX)
  • Effective solid angle: 0.13 sr
  • Energy resolution: 136 eV (Mn-Kα)
  • Element detection for Z ≥ 5

Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtered TEM (EFTEM)

  • Imaging energy filter Gatan GIF Tridiem 863
  • 4-megapixel CCD camera (Gatan, UltraScan 1000)
  • Energy resolution: 0.7 eV

Specimen holders

  • Single-tilt holder
  • 2 low-background double-tilt holders with Be hex-ring
  • In-situ single-tilt holder for heating experiments up to 1000 °C (Philips, Modell PW6592)

Contact

Dr. René Hübner
Electron Microscopy Laboratory
IBA/OSA
r.huebnerAthzdr.de
Phone: +49 351 260 3174
Fax: +49 351 260 13174