Talos F200X (FEI)

Electron source

• Type: X-FEG
• Accelerating voltage: 200 kV
• Brightness: 1.8 x 10⁹ A cm^-2 sr^-1 (bei 200 kV)

Illumination

• 2-condenser lense system

Imaging

• Objective: A-Twin lense
• TEM information limit: 0.12 nm
• TEM point resolution: 0.25 nm
• STEM-HAADF resolution: 0.16 nm

Cameras and detectors

• 16-megapixel CMOS camera (FEI Ceta 16M) for TEM
• High-angle annular dark-field (HAADF) detector for STEM
• On-axis bright-field/dark-field detector (BF/DF) for STEM

Energy-dispersive X-ray spectroscopy (EDXS)

• Super-X system (4 symmetrical SDD)
• Effective solid angle: 0.9 sr
• Energy resolution: 136 eV (Mn-Kα, 10 kcps)
• Element detection for Z ≥ 5

Specimen holders

• Single-tilt holder
• Low-background double-tilt holder with Be hex-ring
• High-visibility low-background double-tilt holder with SoftLoc (Mo or bronze)
• In-situ single-tilt straining holder (Gatan, Model 654 with Accutroller Model 902)