X-ray diffractometer at the Helmholtz Institute Freiberg for Resource Technology (HIF) at HZDR

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Title X-ray diffractometer at the Helmholtz Institute Freiberg for Resource Technology (HIF) at HZDR
Description Analysis on the X-ray diffractometer for quantification of phases and materials in substances: Such analyses are required both in the exploration of new deposits and for the characterization of technological processes.
Copyright HZDR/Frank Schinski
Picture Id 54409
Date 09.08.2016
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