HeFIB Schedule

Monday

Tuesday

Wednesday

   
 

Time

Title

Speaker

 

Time

Title

Speaker

 

Time

Title

Speaker

   
   

Break/refreshments

 

Analytic

08:30

Thermal Effects from Light Ion Beams in Thin Films

Notte

Nanofabrication

16:20

A revolutionary quantum computer device fabricated from implanted ordered arrays of single donor atoms in silicon

Jamieson

   
   

Inivted Speaker

 

09:00

FIB milling strategies for the mitigation of beam-induced artifacts in polymer thin films: He vs. Ga

Allen

09:00

Binary Collision Computer Simulation of FIB Induced Erosion and Atomic Mixing in Nanostructures

Möller

   
   

Sponsor contribution

 

09:20

METALLOGRPHY OF THIN FILMS WITH FOCUSED ION BEAMS

Chiriaev

09:20

Site-controlled Si Nanodot Formation for a RT-SET via Ion Beam Mixing and Phase Separation

Xu

   
   

Other

 

09:40

Compositional analysis and in situ experiments in the HIM

Klingner

09:40

Latest development for failure analysis – When ions meet chemistry

Delobbe

   
       

10:00

SIMS performed on the Helium Ion Microscope: a unique tool for highest spatial resolution imaging and correlative microscopy

Wirtz

10:00

Cs ion coldbeam suitability for circuit edit and other nanomachining applications

Greenzweig

   

2D Materials

10:30

Welcome

   

10:20

Coffee

   

10:20

Coffee

     

10:40

Graphene nano-electro-mechanical (GNEM) devices functionalized by using helium ion beam

Mizuta

New imaging approaches

10:50

Transmission He Ion Microscopy

Kavanagh

Defects

10:50

Nanoscale defect engineering in ferroelectric thin films by focused ion beam microscopy

McGilly

   

11:10

Anderson localization of graphene by sub-nm diameter helium ion beam irradiation

Ogawa

11:20

Towards observing diffraction in a HIM

Herrmann

11:20

Defect production in supported two-dimensional materials under ion irradiation  from atomistic simulations: the substrate is crucial

Kretschmer

   

11:30

In-situ measurement of electron conduction modulation in graphene by helium ion beam irradiation

Nakaharai

11:40

Multi-Modal Characterization with Secondary Ion Mass Spectrometry on ZEISS ORION NanoFab

Braggin

11:40

Modification of MoS2 with Helium Ion Beam: Fabrication of Gate-Tunable Memristor

Keane

   

11:50

He-Ion Microscopy Combined with Micromanipulators for Pick & Place, Electrical & Mechanical Characterization, and Other Tasks

Smith

12:00

Characterising Carbon-based materials in the HIM: probing the invisible with secondary electron spectroscopy

Abrams

12:00

Application of Gas Field Ion Source to Patterning Nanoscale Magnetic Structures

Bali

   

12:10

Lunch

   

12:20

Lunch

 

12:20

Writing Magnetic Domains with a Helium Ion Microscope

Emmrich

   

Imaging and Biological applications

14:00

Helium and neon ion microscopy and milling for microbiological applications

Maasilta

Lithography

14:00

Understanding Focused Ion Beam Sputtering and Gas-Assisted Etching via the EnvizION Monte Carlo Simulation

Rack

 

12:40

Summary/Outlook

     

14:30

FIB/SEM Processing of Biological Samples

Wolff

14:30

Helium Ion Based Lithography of Advanced Resists

Feldman

 

12:50

Lunch

     

14:50

Correlative Microscopy with Light, Electrons and Ions in Environmental Microbiology

Schmidt

14:50

Reduced proximity and improved depth of field by using resist-based lithography with helium ions

Flatabø

 

14:30

Ion Beam Center @ HZDR tour

   

15:10

Comparison of image fusion techniques for ion beam based correlative microscopy

Vollnhals

15:10

Advanced FIB nanopatterning employing a high precision sample stage

Bauerdick

 

17:00

   

15:30

Multimodal Imaging for Physical and Chemical Surface Characterization using a Combined Helium Ion Microscope and Secondary Ion Mass Spectrometry Platform

Ovchinnikova

 

15:30

Fabrication of Plasmonic Nanostructures by He+ and Ga+ Milling

Westphal

           

15:50

Coffee

     

Excursion and dinner

           

New Ion Beams

16:20

ColdFIB – a new FIB column with a laser cooled source

Viteau

               

16:50

New non‐Gallium FIB Alternatives for Nanofabrication

Mazarov

               

17:10

Ion Sources for Focused Ion Beam Applications

Bischoff

               

17:30

Source Shot Noise Mitigation in Helium Ion and Focused Ion Beam Microscopy

Murray-Bruce

               

17:50

The Xe plasma FIB - the other extreme

Mulders

               

18:10

Revolutionary Field Emission Thruster Developments for Nano-satellites at TU Dresden and its correlative LMIS-applications at terrestrial Implanters.

Laufer

               
 

18:30

Posters

                 
 

20:00