Ultra fast scanned electron beam X-ray CT for two-phase flow measurement


Ultra fast scanned electron beam X-ray CT for two-phase flow measurement

Hampel, U.; Fischer, F.; Schleicher, E.; Hoppe, D.

We developed an ultra fast X-ray CT scanner based on scanned electron beam technology. The new device enables ultra fast two-dimensional phase fraction imaging in flow cross-sections at frame rates up to 7 kHz. As an example flow measurement in a 60 mm diameter bubble column is presented.

Keywords: Electron beam CT; X-ray CT; multiphase flow imaging

  • Contribution to proceedings
    CT2008: TOMOGRAPHY CONFLUENCE - An International Conference on the Applications of Computerized Tomography, 15.-17.02.2008, Kanpur, India
    AIP Conference Proceedings 1050: American Institute of Physics, 978-0-7354-0578-3, 144-150
  • Invited lecture (Conferences)
    CT2008: TOMOGRAPHY CONFLUENCE - An International Conference on the Applications of Computerized Tomography, 15.-17.02.2008, Kanpur, India

Permalink: https://www.hzdr.de/publications/Publ-11230
Publ.-Id: 11230