Ultra fast scanned electron beam X-ray CT for two-phase flow measurement
Ultra fast scanned electron beam X-ray CT for two-phase flow measurement
Hampel, U.; Fischer, F.; Schleicher, E.; Hoppe, D.
We developed an ultra fast X-ray CT scanner based on scanned electron beam technology. The new device enables ultra fast two-dimensional phase fraction imaging in flow cross-sections at frame rates up to 7 kHz. As an example flow measurement in a 60 mm diameter bubble column is presented.
Keywords: Electron beam CT; X-ray CT; multiphase flow imaging
-
Contribution to proceedings
CT2008: TOMOGRAPHY CONFLUENCE - An International Conference on the Applications of Computerized Tomography, 15.-17.02.2008, Kanpur, India
AIP Conference Proceedings 1050: American Institute of Physics, 978-0-7354-0578-3, 144-150 -
Invited lecture (Conferences)
CT2008: TOMOGRAPHY CONFLUENCE - An International Conference on the Applications of Computerized Tomography, 15.-17.02.2008, Kanpur, India
Permalink: https://www.hzdr.de/publications/Publ-11230
Publ.-Id: 11230