Investigation of defects in nitrogen implanted n-type ZnO by capacitance spectroscopy and simultaneous optical excitation

Schmidt, M.; Ellguth, M.; Lüder, T.; von Wenckstern, H.; Pickenhain, R.; Grundmann, M.; Brauer, G.; Skorupa, W.; Helm, M.

Poster
25th International Conference on Defects in Semiconductors (ICDS-25), 20.-24.07.2009, Petersburg, Russia

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