Ion beams as a tool for advanced structural characterization in ZnO-based materials
Ion beams as a tool for advanced structural characterization in ZnO-based materials
Redondo-Cubero, A.; Lorenz, K.; Alves, E.; Gago, R.; Hierro, A.; Vinnichenko, M.; Chauveau, J.-M.; Nakamura, A.; Krause, M.; Temmyo, J.; Muñoz, E.; Brandt, M.; Henneberger, F.
This work shows the application of ion beam techiques to the structural characterization of different ZnO compounds. Taking advantage of ion channelling phenomena in combination with some specific nuclear resonances, the individual evaluation of defects in the IIb-metal and O sublattices is achieved.
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 16720) publication
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Invited lecture (Conferences)
SPIE Photonics West, Optoelectronic Materials and Devices, Oxide-based Materials and Devices III (Conference 8263), 22.-25.01.2012, San Francisco, USA
Permalink: https://www.hzdr.de/publications/Publ-16720
Publ.-Id: 16720