An implementation of dead-time corrections in microbeam measurements on a pixel by pixel basis


An implementation of dead-time corrections in microbeam measurements on a pixel by pixel basis

Munnik, F.

In microbeam measurements on inhomogeneous samples large variations in count-rate can occur. These variations result in variations in dead-time that have to be used to correct elemental distribution maps. However, the dead-time is usually not available on a pixel by pixel basis. In this work, a simple model is proposed to calculate the dead-time for each pixel. Measurements to determine the dead-time per event, needed in the model, are presented and the dead-time corrections are presented for real samples.

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Permalink: https://www.hzdr.de/publications/Publ-22298
Publ.-Id: 22298