An implementation of dead-time corrections in microbeam measurements on a pixel by pixel basis
An implementation of dead-time corrections in microbeam measurements on a pixel by pixel basis
Munnik, F.
In microbeam measurements on inhomogeneous samples large variations in count-rate can occur. These variations result in variations in dead-time that have to be used to correct elemental distribution maps. However, the dead-time is usually not available on a pixel by pixel basis. In this work, a simple model is proposed to calculate the dead-time for each pixel. Measurements to determine the dead-time per event, needed in the model, are presented and the dead-time corrections are presented for real samples.
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 22298) publication
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Poster
Workshops für Ionenstrahlen und Nanostrukturen, 22.-24.07.2015, Heidelberg, Deutschland
Permalink: https://www.hzdr.de/publications/Publ-22298
Publ.-Id: 22298