Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling


Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling

Gkogkou, D.; Shaykhutdinov, T.; Oates, T. W. H.; Gernert, U.; Schreiber, B.; Facsko, S.; Hildebrandt, P.; Weidinger, I. M.; Esser, N.; Hinrichs, K.

The present investigation aims to study the optical response of anisotropic Ag nanoparticle arrays deposited on rippled silicon substrates by performing a qualitative comparison between experimental and theoretical results. Spectroscopic ellipsometry was used along with numerical calculations using finite-difference time-domain (FDTD) method and rigorous coupled wave analysis (RCWA) to reveal trends in the optical and geometrical properties of the nanoparticle array. Ellipsometric data show two resonances, in the orthogonal x and y directions, that originate from localized plasmon resonances as demonstrated by the calculated near-fields from FDTD calculations. The far-field calculations by RCWA point to decoupled resonances in x direction and possible coupling effects in y direction, corresponding to the short and long axis of the anisotropic nanoparticles, respectively.

Keywords: Anisotropy; FDTD; Nanostructure characterization; Optical modeling; RCWA; Spectroscopic ellipsometry

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Publ.-Id: 24393