Comparative study of ion implanted SiC by slow positron implantation and Rutherford backscattering/ channeling spectroscopies
Comparative study of ion implanted SiC by slow positron implantation and Rutherford backscattering/ channeling spectroscopies
Brauer, G.
-
Lecture (others)
Texas Christian University (Department of Physics), Ft. Worth/TX, 02.11.1998 -
Lecture (others)
University of Texas at Arlington (Physics Department), Arlington/TX, 03.11.1998
Permalink: https://www.hzdr.de/publications/Publ-2577
Publ.-Id: 2577