Focused-ion-beam assisted micropatterning for experiments under extreme conditions


Focused-ion-beam assisted micropatterning for experiments under extreme conditions

Helm, T.

Für diesen Vortrag hat keine inhaltliche Kurzangabe vorgelegen.

  • Invited lecture (Conferences)
    Helmholtz MML-Workshop, 13.-15.02.2019, Dresden, Deutschland
  • Invited lecture (Conferences)
    EMFL User Meeting, 25.06.2019, Warsaw, Poland

Permalink: https://www.hzdr.de/publications/Publ-30423
Publ.-Id: 30423