Focused-ion-beam assisted micropatterning for experiments under extreme conditions
Focused-ion-beam assisted micropatterning for experiments under extreme conditions
Für diesen Vortrag hat keine inhaltliche Kurzangabe vorgelegen.
-
Invited lecture (Conferences)
Helmholtz MML-Workshop, 13.-15.02.2019, Dresden, Deutschland -
Invited lecture (Conferences)
EMFL User Meeting, 25.06.2019, Warsaw, Poland
Permalink: https://www.hzdr.de/publications/Publ-30423
Publ.-Id: 30423