XPS investigations for the study of Ge clustering in SiO2


XPS investigations for the study of Ge clustering in SiO2

Ostwald, S.; Schmidt, B.; Heinig, K.-H.

  • Lecture (Conference)
    8th European Conf. on Appl. of Surface and Interface Analysis (ECASIA´99), Sevilla, Spain, October 4-8, 1999

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Publ.-Id: 3113