Solid–liquid interface analysis with in‐situ Rutherford backscattering and electrochemical impedance spectroscopy


Solid–liquid interface analysis with in‐situ Rutherford backscattering and electrochemical impedance spectroscopy

Bergmann, U.; Apelt, S.; Khojasteh, N. B.; Heller, R.

A novel Rutherford backscattering spectrometry (RBS) method is presented to investigate the interface between a solid surface and a surrounding liquid. The introduced measurement system allows to observe and quantify adsorption at the solid–liquid interface and the formation of the electrochemical double layer (EDL). BaCl2 as a bicomponent electrolyte and a Si3N4 membrane surface are chosen as a model system to prove the capabilities of the setup. The results of these RBS measurements are combined with electrochemical impedance spectroscopy (EIS) to validate the findings for the solid–liquid interface under study. Complementary results and discrepancies regarding the formation of the EDL are discussed.
Author keywords: electrochemical double layer, electrochemical impedance spectroscopy, Rutherford backscattering spectroscopy, silicon nitride

Keywords: Rutherford backscattering spectrometry; electrochemical double layer; electrochemical impedance spectroscopy; point of zero charge

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Permalink: https://www.hzdr.de/publications/Publ-31841
Publ.-Id: 31841